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Conferences

Searching for best Karatsuba recurrences

Author(s)
Cagdas Calik, Morris J. Dworkin, Nathan Dykas, Rene C. Peralta
Efficient circuits for multiplication of binary polynomials use what are known as Karatsuba recurrences. These methods divide the polynomials of size kn into k

Integrated Operations Management for Distributed Manufacturing

Author(s)
Timothy A. Sprock, Michael E. Sharp, William Z. Bernstein, Michael P. Brundage, Moneer M. Helu, Thomas D. Hedberg Jr.
In traditional manufacturing operations management systems, the four pillars of ISA-95 (production, quality, maintenance, inventory) are each implemented as

A Review Of Machine Learning Applications In Additive Manufacturing

Author(s)
Saadia A. Razvi, Shaw C. Feng, Anantha Narayanan Narayanan, Yung-Tsun T. Lee, Paul W. Witherell
Variability in product quality continues to pose a major barrier to the widespread application of additive manufacturing (AM) processes in production

Pulse-Driven High-Tc Josephson Junctions for Quantum Voltage Devices

Author(s)
Adam C. Weis, Nathan E. Flowers-Jacobs, E Y. Choi, H Li, J C. LeFebvre, Shane Cybart, Stuart Berkowitz, Horst Rogalla, Samuel P. Benz
Josephson junction arrays are the basis for quantum-accurate dc and ac voltage standards, including artificial voltage-noise references used in noise

Towards Operational Use of Unit Manufacturing Process Models

Author(s)
Amogh Kulkarni, William Z. Bernstein, David Lechevalier, Daniel Balasubramanian, Gabor Karsai, Peter O. Denno
Unit Manufacturing Processes (UMP) are models that capture succinct definitions of individual manufacturing steps in a manufacturing system. They are used to

Quantifying Macroeconomic Resilience Dividends in Cedar Rapids

Author(s)
Juan F. Fung, Jennifer F. Helgeson, Cheyney M. O'Fallon, David H. Webb, Harvey Cutler
Cedar Rapids, Iowa offers a unique case study in planning for increased resilience. In 2008, Cedar Rapids experienced severe flooding. Rather than simply

Wireless Channel Model Development Across the Product Life Cycle

Author(s)
David Michelson, Camillo A. Gentile, Nada T. Golmie, Jeanne T. Quimby, Catherine A. Remley, Ken Gracie, Yvo de Jong
Wireless channel models play a critical role at all stages of the product life cycle, from standards development to network deployment. However, the distinctive

Machine Learning in a Quality Managed RF Measurement Workflow

Author(s)
Aric W. Sanders, John Bass, Arpita Bhutani, Mary A. Ho, James C. Booth
Advances in artificial intelligence, or more specifically machine learning, have made it possible for computers to recognize patterns as well or better than