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Conferences

Controlling the Reaction Pathway to Tune Packaging Epoxy Properties

Author(s)
Polette Centellas, Ran Tao, Andrew Korovich, Alexander Landauer, Amanda Forster, Siena Iavarone-Garza, Dante Ribeiro, Huong Giang Nguyen, Jan Obrzut, Stian Romberg, Christopher Soles
Semiconductor packaging demands materials with precisely tuned properties. We demonstrate that the thermoset processing pathway strongly influences functional...

The Effect of Different Gases on Critical Flow Nozzles

Author(s)
John Wright, Christopher Crowley, Aaron Johnson, Shinichi Nakao
Critical nozzles and critical flow venturis are widely used gas flow meters because of their excellent calibration stability and well-developed flow theory. It...

Explainable Validation and Feature Reduction in Machine Learning

Author(s)
Fenrir Badorf, Francis Durso, Callie Walker, Megan Olsen, M S Raunak, D. Richard Kuhn
Although there are many available approaches for designing machine learning models and experiments, not all of these approaches are explainable or interpretable...

CCAT: Silicon-Platelet Feedhorns for Submillimeter Wavelengths

Author(s)
Jason Austermann, James Beall, Johannes Hubmayr, Matthew Koc, Joel Ullom, Jeffrey Van Lanen, Michael Vissers, Jordan Wheeler
Silicon-platelet feedhorn arrays are an established technology at millimeter wavelengths that, for some applications, can provide significant advantages over...

EZ-SAVE: Evaluation of Easy-to-Deploy Source Address Validation Policies

Author(s)
Nicholas Scaglione, Justin Furuness, Yossi Gilad, Hemi Leibowitz, Cameron Morris, Bing Wang, Amir Herzberg, Kotikalapudi Sriram
The lack of Source Address Validation (SAV) is a major vulnerability of the Internet, abused in many Denial of Service (DoS) and other attacks. Several IETF...

Harnessing the extreme ultraviolet for critical dimension metrology

Author(s)
Bryan Barnes, Purnima P. Balakrishnan, John Burnett, Aaron Chew, Colton Dudley, Thomas Germer, Steven Grantham, Stephanie Moffitt, Eric Shirley, Martin Sohn, Daniel Sunday
The semiconductor industry has long adopted visible and ultraviolet wavelengths for optical critical dimension (OCD) measurements. Decreasing feature sizes...

Accurate Volume Determination for Low Gas Flow Standards

Author(s)
Jodie Pope, Christopher Crowley, Max Low, John Wright, Aaron Johnson
The National Institute of Standards and Technology (NIST) has developed the Semiconductor Low Flow Standard (SLowFlowS), a new rate-of-rise (RoR) gas flow...

Link-to-System Mapping for 5G NR Sidelink System Simulations

Author(s)
Thomas Henderson, Peng Liu, Chunmei Liu, Fernando Cintron
We describe extensions to the Network Simulator version 3 (ns-3) New Radio (NR) sidelink simulator for higher-fidelity packet error models based on an extensive...

U.S. Election Expert Perspectives on End-to-End Verifiable Voting Systems

Author(s)
Julie Haney, Shanee Dawkins, Sandra Prettyman, Mary Theofanos, Kristen Greene, Kristin Koskey, Jody Jacobs
By using cryptographic techniques, end-to-end verifiable (E2EV) voting systems have been proposed as a way to increase voter trust and confidence in elections...
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