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Conferences

Results in Coastal Waters With High Resolution In Situ Spectral Radiometry: The Marine Optical System ROV

October 5, 2007

Author(s)

M Yarbrough, M Feinholz, S Flora, Terrance Houlihan, B. Carol Johnson, Yong S. Kim, Marilyn Y. Murphy, Michael Ondrusek, D K. Clark

The solar normalized water-leaving spectral radiance is a basic ocean color remote-sensing parameter required for the vicarious calibration and bio-optical...

Calibration of Modified Parallel-Plate Rheometer Using Standard Oil and Lattice Boltzmann Simulation

October 3, 2007

Author(s)

Chiara F. Ferraris, M R. Geiker, Nicos Martys, N V. Muzzatti

Fluid flow patterns in traditional rotational rheometers are generally well known and rheological parameters such as viscosity can be easily calculated from...

Precise Time Synchronization in Semiconductor Manufacturing

October 3, 2007

Author(s)

Vinod Anandarajah, Naveen Kalappa, Julien L. Baboud, Ya-Shian Li-Baboud, James Moyne

In today's fabs, coordination of time-based information throughout the factory and enterprise has become necessary. This has driven the need to have time...

Evaluation of a Portable Hyperspectral Imager for Medical Imaging Applications

October 2, 2007

Author(s)

David W. Allen, Maritoni A. Litorja, Steven W. Brown, Joseph P. Rice, Yuqin Zong

Portable hyperspectral imagers are becoming commonly available as a commercial product. A liquid crystal tunable filter based CCD imager was evaluated and...

NIST optical fiber power measurements: intramural and international comparisons

October 1, 2007

Author(s)

Igor Vayshenker, John H. Lehman, David J. Livigni, Joshua A. Hadler

We discuss the results of intramural comparisons of NIST laser and optical fiber power meter (OFPM) measurements, and the results of OFPM comparisons between...

Heat Transfer Effects in a Water Calorimeter for Measuring the Absorbed Dose of Therapy-Level Radiation Beams

October 1, 2007

Author(s)

Ronald E. Tosh, Huaiyu H. Chen-Mayer

Water calorimetry that directly measures the temperature rise (at the mK level) due to radiation heating is used as a primary standard for therapy-level gamma...

Software Assurance with SAMATE Reference Dataset, Tool Standards, and Studies

October 1, 2007

Author(s)

Paul E. Black

Today's avionics systems depend more and more on software from many sources: vendors, subcontractors, in-house, and open source. System interactions are exposed...

Sensor Standards Harmonization--Path to Achieving Sensor Interoperability

October 1, 2007

Author(s)

Kang B. Lee

Distributed sensor networks are emerging technology for building applications in control and condition monitoring of equipment and machinery in government and...

Progress Towards Traceable Nanoscale Optical Critical Dimension Metrology for Semiconductors

October 1, 2007

Author(s)

Heather J. Patrick, Thomas A. Germer

Non-imaging optical critical dimension (OCD) techniques have rapidly become a preferred method for measuring nanoscale features in semiconductors. OCD relies...

Truncated Singular Value Decomposition Method for Calibrating a Stokes Polarimeter

October 1, 2007

Author(s)

Bruno Boulbry, J C. Ramella-Roman, Thomas A. Germer

We present a method for calibrating polarimeters that uses a set of well-characterized reference polarizations and makes no assumptions about the optics...

Photomask Applications of Traceable Atomic Force Microscope Dimensional Metrology at NIST

October 1, 2007

Author(s)

Ronald G. Dixson, Ndubuisi G. Orji, James E. Potzick, Joseph Fu, Michael W. Cresswell, Richard A. Allen, S J. Smith, Anthony J. Walton

The National Institute of Standards and Technology (NIST) has a multifaceted program in AFM dimensional metrology. Two major instruments are being used for...

Development of a Field Test to Measure Gaseous Air Cleaner Performance in a Multizone Building

October 1, 2007

Author(s)

Cynthia H. Reed, Steven J. Nabinger, Andrew K. Persily, Victor Henzel

The performance of gaseous air cleaners for commercial and residential buildings has typically been evaluated using test protocols developed for a controlled...

Preliminary Hard X-ray Micro-spectroscopic investigations on Thin-Film Ta-and-W Based Diffusion Barriers for Copper Interconnect Technology

October 1, 2007

Author(s)

J Ablett, Joseph Woicik, Zs Tokei

Reference Material for Assessing Forensic SIM Tools

October 1, 2007

Author(s)

Wayne Jansen, Aurelien M. Delaitre

Subscriber Identity Modules (SIMs) are a fundamental standardized component of most cell phones used worldwide. A SIM can be removed from a phone handset and...

Object-oriented Model for IEEE 1588 Standard

October 1, 2007

Author(s)

Kang B. Lee, Eugene Song

The IEEE 1588 standard specifies a protocol enabling precise synchronization of clocks in measurement and control systems implemented with technologies such as...

Internal Photoemission Spectroscopy of Metal Gate/High-k/ Semiconductor Interfaces

September 30, 2007

Author(s)

Nhan V. Nguyen, Oleg A. Kirillov, Hao Xiong, John S. Suehle

Internal photoemission (IPE) spectroscopy is a powerful technique for investigating electronic properties of inhomogeneous interfaces of hetero-structures. Two...

Non-Contact Measurement of Cardiac Electromagnetic Field in Mice Using a Microfabricated Atomic Magnetometer

September 30, 2007

Author(s)

B Lindseth, P Schwindt, John E. Kitching, D Fischer, V Shusterman

The development of clinical applications of magnetocardiography has been impeded by the large size of the magnetic-field measurement systems. Here we present...

Fair Bandwidth Sharing under Random Flow Arrivals/Departures: Metastability & Flow Admission Control

September 30, 2007

Author(s)

Vladimir V. Marbukh

Flow-level performance of fair bandwidth sharing protocols under random flow arrivals/departures is not sufficiently understood due to intractability of the...

NIST Microwave Scattering Parameter and Power Measurement Services

September 30, 2007

Author(s)

Ronald A. Ginley

This paper describes the microwave scattering parameter (s-parameter) and power measurement services available at NIST. This includes what is measured in each...

Electro-Thermal, Transient, Mixed-Mode 2D Simulation Study of SiC Power Thyristors Operating Under Pulsed-Power Conditions

September 30, 2007

Author(s)

Leonardo Hillkirk, Allen R. Hefner Jr., Robert W. Dutton, Stephen B. Bayne, Heather O'Brien

An electro-thermal, transient device simulation study of Silicon Carbide (SiC) power thyristors operating in a pulsed-power circuit at extremely high current...

Scanning Kelvin Force Microscopy For Characterizing Nanostructures in Atmosphere

September 30, 2007

Author(s)

Joseph Kopanski, Muhammad Afridi, Stoyan Jeliazkov, Weirong Jiang, Thomas R. Walker

The Electrostatic Force Microscope (EFM) and its variants are of interest for the measurement of potential distributions within nanostructures, and for work...

The Characterization of Silicon-Based Molecular Devices

September 30, 2007

Author(s)

Nadine Gergel-Hackett, Christina Hacker, Lee J. Richter, Oleg A. Kirillov, Curt A. Richter

In order to realize molecular electronic (ME) technology, an intermediate integration with more traditional silicon-based technologies will likely be required...

Methods to Characterize the Electrical and Mechanical Properties of Si Nanowires

September 30, 2007

Author(s)

Qiliang Li, Sang-Mo Koo, Hao Xiong, Monica D. Edelstein, John S. Suehle, Xiaoxiao Zhu, D. E. Ioannou, Curt A. Richter

We report metrology methods to characterize nanowires. In this work, representative devices and test structures, including nanoelectromechanical switches, non...

CD Reference Materials Fabricated on Monolithic 200 mm Wafers for Automated Metrology Tool Applications

September 30, 2007

Author(s)

Richard A. Allen, Ronald G. Dixson, Michael W. Cresswell, William Gutherie, Byron J. Shulver, Andrew S. Bunting, J. T. Stevenson, Anthony Walton

Recently, prototype isolated-line, single-crystal CD reference materials (SCCDRMs) with linewidths as narrow as 40 nm ? 1.5 nm have been reported. These...

Spin-polarized Inelastic Electron Tunneling Spectroscopy of Molecular Magnetic Tunnel Junctions

September 30, 2007

Author(s)

Wenyong Wang, Curt A. Richter

. In this study, we fabricate molecular magnetic tunnel junctions and demonstrate that inelastic electron tunneling spectroscopy technique can be utilized to...

Modeling and Analysis of Scatterometry Signatures for Optical Critical Dimension Reference Material Applications

September 30, 2007

Author(s)

Heather Patrick, Thomas Germer, Michael W. Cresswell, Richard A. Allen, Ronald G. Dixson, Michael Bishop

Conformance Test Suite for CBEFF Biometric Information Records

September 29, 2007

Author(s)

Yooyoung Lee, Fernando L. Podio, Mark Jerde

Deployment of standards-based biometric technologies is expected to significantly raise levels of security for critical infrastructures that has not been...

Fab-wide Network Time Synchronization - Simulation and Analysis

September 28, 2007

Author(s)

Naveen Kalappa, Vinod Anandarajah, Julien L. Baboud, Ya-Shian Li-Baboud, James Moyne

In today?s fabs, coordination of time-based information throughout the factory and enterprise has become necessary. This has driven the need to have time...

Analysis of Thermocouple Behavior in Compartment Fires

September 27, 2007

Author(s)

Sung C. Kim, Anthony P. Hamins, Matthew F. Bundy, Gwon Ko, Erik L. Johnsson

The present study uses numerical simulations and analytical solutions to investigate the heat transfer processes associated with bare bead and double shield...

North American Environmental Compliance Attitudes Towards Electronics

September 27, 2007

Author(s)

Krista Botsford, John V. Messina, Eric D. Simmon

More and more countries are beginning eco-compliance legislation for electronics products. Where does the USA stand? This paper will discuss the following areas...

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