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Conferences

The Residual Resistance Ratio of High-Purity Platinum

Author(s)
Weston L. Tew, William E. Murdock, Michal J. Chojnacky, Dean C. Ripple
High-purity platinum wire is produced for use in both Standard Platinum Resistance Thermometers (SPRTs) and type S and type R thermocouples. The resistance...

Alternative Cooling Technology Options

Author(s)
J S. Brown, Piotr A. Domanski
This paper considers the alternative cooling technologies studied by Fisher et al. (1994) and assesses their current potential to compete with or to replace...

Accurate Nanometer-Scale Imaging and Measurements with SEM

Author(s)
Bradley N. Damazo, Bin Ming, Premsagar P. Kavuri, Andras Vladar, Michael T. Postek
Scanning electron microscopes (SEMs) are incredibly versatile instruments for millimeter to nanometer scale imaging and measurements of size and shape. New...

A Note on Visualizing Smoke and Fire

Author(s)
Glenn P. Forney
Realistic visualization methods are important for applications where one wishes to observe data effects rather than examine data quantitatively. This note...

Simulation of a MIMO System in a Reverberation Chamber

Author(s)
Helge Fielitz, Kate Remley, Christopher L. Holloway
We present a general method to test MIMO antenna setups and algorithms in a reverberation chamber. Our test set-up enables measurement of data throughput using...

Dual comb-based characterization of rapidly tuned lasers

Author(s)
Fabrizio R. Giorgetta, Esther Baumann, Ian R. Coddington, William C. Swann, Nathan R. Newbury, Zeb Barber, Peter Roos
Time-resolved, high-accuracy and high-resolution spectroscopy of rapidly tuned cw lasers is critical to realizing their full potential for sensing, but is not...

Real-Time Generation of the SIM Time Scale (SIMT) from International Clock Comparisons

Author(s)
Michael A. Lombardi, Jose M. Lopez, Andrew N. Novick, Francisco Jimenez, Nelida Diaz-Munoz, Eduardo de Carlos Lopez, Jean-Simon Boulanger, Raymond Pelletier, Ricardo de Carvalho, Raul Solis, Harold Sanchez, Liz C. Forero, Junior Gordon, Daniel Perez, Eduardo Bances, Leonardo Trigo, Victor Masi, Henry Postigo, Anthony Questelles, Anselm Gittens, Rodrigo Ramos P.
The Sistema Interamericano de Metrologia (SIM) is one of the world’s five major regional metrology organizations (RMOs). The SIM members are the national...

Measurement of Shielding Effectiveness of Electrically-Small Enclosures

Author(s)
Christopher L. Holloway, Colton R. Dunlap, John M. Ladbury, Joshua A. Gordon, Jason B. Coder, Galen H. Koepke
In the following we propose a technique for determining the shielding effectiveness (SE) an electrically small enclosure. In particular, we use this technique...
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