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Conferences

On-chip, photon-number-resolving, telecom-band detectors for scalable photonic information processing

Author(s)
Thomas Gerrits, Nick Thomas-Peter, James Gates, Adriana E. Lita, Benjamin Metcalf, Brice R. Calkins, Nathan A. Tomlin, Anna E. Fox, Antia A. Lamas-Linares, Justin Spring, Nathan Langford, Richard P. Mirin, Peter Smith, Ian Walmsley, Sae Woo Nam
We demonstrate the operation of an integrated photon number resolving transition edge sensor (TES), operating in the telecom band at 1550 nm, employing an...

The Date-Time Vocabulary

Author(s)
Mark H. Linehan, Edward J. Barkmeyer Jr., Stan Hendryx
The Date-Time Vocabulary is a new OMG specification that models continuous time, discrete time, the relationship of events and situations to time, language...

Information Required for Dimensional Measurement

Author(s)
John A. Horst, Curtis Brown, Robert Brown, Larry Maggiano, K Summerhays, Thomas R. Kramer
Much work has been done by standards organizations to model dimensional measurement information in digital formats, but the work done has revealed that standard...

Evolutionary Construction of de Bruijn Sequences

Author(s)
Meltem Sonmez Turan
A binary de Bruijn sequence of order n is a cyclic sequence of period 2^n, in which each n-bit pattern appears exactly once. These sequences are commonly used...

A method for comparing remote optical clocks over a free-space optical link

Author(s)
William C. Swann, Fabrizio R. Giorgetta, Ian R. Coddington, Esther Baumann, Jean-Daniel Deschenes, Laura C. Sinclair, Alexander M. Zolot, Nathan R. Newbury
We demonstrate a method to compare optical clocks approaching 10 -17 uncertainties through the exchange of optical pulses from phase-locked frequency combs. We...

Traceability of high-speed electrical waveforms at NIST, NPL, and PTB

Author(s)
Paul D. Hale, Dylan F. Williams, Andrew M. Dienstfrey, Chih-Ming Wang, Jeffrey A. Jargon, David Humphreys, Matthew Harper, Heiko Fuser, Mark Bieler
Instruments for measuring high-speed waveforms typically require calibration to obtain accurate results. The national metrology institutes of the United States...

Displacement Sensor for Detecting Sub-micrometer Motion

Author(s)
Svetlana Avramov-Zamurovic1, Jae M. Yoo, Nicholas Dagalakis, Rae Duk Lee
This paper describes the design of a nano displacement sensor that detects the presence of a moving platform by using fringing electric field. Its electrodes...

The Permanent Magnet System for NIST-4

Author(s)
Stephan Schlamminger
At the National Institute of Standards and Technology a new watt balance, NIST-4, is currently being designed. This apparatus will be used to realize the base...

Calibration Techniques for Scanning Microwave Microscopy

Author(s)
Thomas M. Wallis, Atif A. Imtiaz, Alexandra Curtin, Pavel Kabos, H. P. Huber, Joseph J. Kopanski, F. Kienberger
Two techniques are described for calibrating a scanning microwave microscope (SMM). The first technique enables spatially-resolved absolute capacitance...
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