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John D. Gillaspy, B Blagojevic, A Dalgarno, K Fahey, V Kharchenko, J M. Laming, E -. Le bigot, L Lugosi, L P. Ratliff, H W. Schnopper, E H. Silver, E Takacs, Joseph N. Tan, H Tawara, K Tokesi
Abstract: Technological trends are increasingly requiring dimensional metrology at size scales below a micrometer. Scanning probe microscopy has unique
This paper provides a review of experience in the development of standards for optical communications and sensing, considering lessons that may be useful in the
Mass customization has been identified as a competitive strategy by an increasing number of companies. Family-based product design has been recognized as an
This chapter presents a knowledge intensive support paradigm for platform-based product family design and development. The background and current research
We review the evolution of the global standards system and its relationship to industry. We then discuss some of the approaches that governments have taken in
NIST Standard Reference Materials (SRM) are certified reference materials that are developed at NIST and provided to laboratories (industry, government and
For cuprate superconductors and related oxides, we review some aspects of their elastic constants. We consider the systematics of the bulk-modulus/atomic-volume
This chapter describes the efficiency of studying temperature-dependent materials processing/property/performance relationships with MEMS-based microarrays
This manuscript is a review of single crystal growth of high temperature superconducting materials. The introductory sections cover fundamentals of crystal
Aaron J. Miller, Sae Woo Nam, John M. Martinis, Alexander V. Sergienko
Tungsten transition-edge sensors have been demonstrated to have impressive photon-counting capabilities. Of particular interest is the expected impact to the
Kent D. Irwin, James A. Beall, Joern Beyer, Steven Deiker, W.Bertrand (Randy) Doriese, S. L. Ferreira, Gene C. Hilton, Sae Woo Nam, Carl D. Reintsema, Joel Ullom, Leila R. Vale
Superconducting multiplexers make it possible to build arrays of thousands of low-temperature bolometers and microcalorimeters based on superconducting
S Brueck, S Picraux, J Belk, Robert Celotta, W Holton, S Janson, W Kuo, D Nagel, P Penz, A Pisano, R Smith, P Stang, G Sutton, W Tolles, R Trew, M. Young
Michael R. Moldover, K N. Marsh, J M. Barthel, R Buchner
Measurements of the relative electric permittivity (dielectric constant or relative permittivity) e(p,T) and refractive index of fluids n(p,T) as a function of
This review, which has been prepared for the McGraw-Hill 2003 Yearbook of Science and Technology, gives an overview of the thermodynamics of enzyme-catalyzed
System Linearity is a fundamental characterization performed on spectrophotometers. Yet it is one that is not adequately performed on Fourier transform