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Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility, ed. by Cohen, J.S., Mazevet, S., and Kilcrease, D.P.

Published

Author(s)

John D. Gillaspy, B Blagojevic, A Dalgarno, K Fahey, V Kharchenko, J M. Laming, E -. Le bigot, L Lugosi, L P. Ratliff, H W. Schnopper, E H. Silver, E Takacs, Joseph N. Tan, H Tawara, K Tokesi
Citation
Atomic Processes in Plasmas
Publisher Info
AIP , New York, NY

Citation

Gillaspy, J. , Blagojevic, B. , Dalgarno, A. , Fahey, K. , Kharchenko, V. , Laming, J. , Le, E. , Lugosi, L. , Ratliff, L. , Schnopper, H. , Silver, E. , Takacs, E. , Tan, J. , Tawara, H. and Tokesi, K. (2004), Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility, ed. by Cohen, J.S., Mazevet, S., and Kilcrease, D.P., AIP , New York, NY (Accessed May 25, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created January 1, 2004, Updated February 17, 2017