Gillaspy, J.
, Blagojevic, B.
, Dalgarno, A.
, Fahey, K.
, Kharchenko, V.
, Laming, J.
, Le, E.
, Lugosi, L.
, Ratliff, L.
, Schnopper, H.
, Silver, E.
, Takacs, E.
, Tan, J.
, Tawara, H.
and Tokesi, K.
(2004),
Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility, ed. by Cohen, J.S., Mazevet, S., and Kilcrease, D.P., AIP , New York, NY
(Accessed October 9, 2024)
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Visible, EUV, and X-ray Spectroscopy at the NIST EBIT Facility, ed. by Cohen, J.S., Mazevet, S., and Kilcrease, D.P.
Published
Author(s)
, , A Dalgarno, K Fahey, V Kharchenko, J M. Laming, E -. Le bigot, L Lugosi, , H W. Schnopper, E H. Silver, E Takacs, , H Tawara, K Tokesi
Citation
Atomic Processes in Plasmas
Publisher Info
AIP , New York, NY
Pub Type
Books
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 1, 2004, Updated February 17, 2017