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Arvind Balijepalli (Fed)

Project Leader

Dr. Balijepalli is a Project Leader in the Physical Measurement Laboratory at the National Institute of Standards and Technology (NIST). He received his Ph.D. at the University of Maryland, College Park. He joined NIST after completing a joint National Research Council postdoctoral fellowship between NIST and the National Institutes of Health. At NIST, he develops new chip-scale sensing techniques to enable measurements of fundamental biophysical phenomenon at multiple scales ranging from biomolecular interactions of proteins, nucleic acids and small molecules to measurements of dynamics in cell and tissue mimics.

PROJECTS

Electronic Biophysical Measurements

RESEARCH OPPORTUNITIES

Please contact Dr. Arvind Balijepalli at arvind.balijepalli [at] nist.gov to inquire about postdoctoral and collaborative opportunities.

Postdoctoral opportunities are available through a National Research Council (NRC) Fellowship, a 2-year program with application deadlines of February 1 and August 1 each year.

Additional information about the specific opportunities and the program are below:

Publications

High-performance dual-gate graphene pH sensors

Author(s)
Son Le, Seulki Cho, Alexander Zaslavsky, Curt A. Richter, Arvind Balijepalli
High precision biophysical measurements that are portable and performed without prior labeling of the molecules can greatly benefit several areas of

Diffusion-limited reactions in nanoscale electronics

Author(s)
Ryan Evans, Arvind Balijepalli, Anthony J. Kearsley
To quantify interactions between drug molecules and target receptors, a novel nanoscale electronics instrument is under development. The instrument consists of

Patents

DNA NANOTECHNOLOGY-BASED BIOMARKER MEASUREMENT PLATFORM

NIST Inventors
Arvind Balijepalli and Jacob Majikes
patent description The invention will allow precise colocalization of analyte-binding/signal-amplification motifs for easier characterization, as well as the ability to tune, for individual motifs, the binding affinity. This capability will greatly reduce the error rates of the measurements
Created March 12, 2019, Updated October 24, 2022