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Patents

Searches Patent Title, Abstract, Body, Technology Type, and NIST Inventors
Displaying 1 - 11 of 11

SINGLE QUANTUM EMITTER SINGLE PHOTON SOURCE AND PRODUCING A SINGLE PHOTON STREAM

NIST Inventors
Marcelo Davanco
patent description The invention is an integrated photonic device which allows production of a pure stream of on-chip waveguide-bound indistinguishable single-photons from the resonance fluorescence of a single quantum emitter embedded in a multimode on-chip waveguide, for which the quantum emitter

NON-VACUUM, NON-CONTACT SPINNER WAFER CHUCK

NIST Inventors
Glenn Holland
patent description Disclosed is a non-vacuum, non-contact spinner wafer chuck for receiving and indexing a wafer, the non-vacuum, non-contact spinner wafer chuck comprising: a basal member comprising: a wafer-side surface; and a spinner-side surface opposing the wafer-side surface; a fastener
Patent description for Critical-Dimension Localization Microscopy

Apparatus for Critical-Dimension Localization Microscopy

NIST Inventors
Samuel M. Stavis and Craig Copeland
Patent Description Critical-Dimension Localization Microscopy (CDLM) is a new calibration and measurement method that establishes SI-traceability of optical microscopy and enables subnanometer localization accuracy over a submillimeter field. NIST fabricated arrays of sub-resolution apertures in an

DNA NANOTECHNOLOGY-BASED BIOMARKER MEASUREMENT PLATFORM

NIST Inventors
Arvind Balijepalli and Jacob Majikes
patent description The invention will allow precise colocalization of analyte-binding/signal-amplification motifs for easier characterization, as well as the ability to tune, for individual motifs, the binding affinity. This capability will greatly reduce the error rates of the measurements

HIGH-PERFORMANCE ULTRAVIOLET OPTICAL ELEMENTS BASED ON METASURFACE TECHNOLOGY

NIST Inventors
Henri Lezec , Amit Agrawal and Jessie Zhang
patent description The ultraviolet (UV) range (wavelength of light: 200 nm to 400 nm) is a technologically important spectral regime hosting diverse applications such as photolithography, high-resolution imaging, spectroscopy, quantum optics, atomic trapping, etc. Current technology for manipulating

MULTIPLEXED AMPLITUDE MODULATION FLUOROMETRY

NIST Inventors
Anthony J. Kearsley and Gregory A Cooksey
patent description The invention, which we call multiplexed amplitude modulation fluorometry, is a method of signal generation, acquisition, and analysis that can simultaneously detect and distinguish fluorophores contained on or in many distinct samples separated in space and/or wavelength. The