The Metrology with Novel Light Sources project pushes the boundaries of laser-based measurements to perform microscopy, spectroscopy, and other measurements in support of critical application areas spanning from nanoscale materials characterization to laser-based plasma compression for fusion and directed energy. Metrology with novel lights sources reveals physical phenomena that can’t be fully captured by measurements based on conventional visible light lasers.
In this project we develop and test different pulsed light sources for atom probe tomography (APT). These light sources vary in photon energy from the visible to the extreme ultraviolet range of the spectrum (3.5 eV to 40 eV); thus, triggering different physical mechanisms on the atom probe specimens. In partnership with the Nanoscale Reliability Group (MML - 647.05) we use these tools to enable the study of heterogeneous structures and materials relevant to the semiconductor industry, superconducting quantum devices community, and other critical emerging technology areas.
In collaboration with the Quantum Sensors Division, we have developed a tabletop ultrafast x-ray spectroscopy system. This instrument is used for the study of electron dynamics with few picosecond time resolution, with applications in the field of materials for photonics, energy storage, and industrial catalysis. This group was awarded the 2017 Department of Commerce Gold Medal, while the x-ray spectrometer was patented in 2018.
In collaboration with NIST’s Sources and Detectors Group, we are engaging with the high-power ultrafast lasers community to identify their metrology needs and limitations. These lasers with peak powers in the petawatts are being pursued as drivers for energy generation through inertial confinement fusion, next-generation proton sources for cancer therapy, and secondary radiation sources for advanced imaging. Our goal is to support this community in the development and metrology/characterization of their advanced diagnostics tools.