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Nanoelectronics

News and Updates

Events

Projects and Programs

Designing Advanced Scanning Probe Microscopy Instruments

Ongoing
SPM is a general acronym for various probe instruments. The "P" in SPM stands for various types of probe measurements, such as capacitance (C), force (F), tunneling (T), etc. The scanning tunneling microscope (STM), including custom designs at the CNST, uses the quantum mechanical principle of

Designing the Nanoworld: Nanostructure, Nanodevices, and Nano-optics

Ongoing
Developing and exploiting nanodevices for quantum and nanotechnologies requires nanoscale and atomic scale modeling of ultrasmall structures, devices, their operation, and their response to probes. Key challenges of understanding physics at the quantum/classical interface and measurement at the

Dynamic EUV Imaging and Spectroscopy for Microelectronics

Ongoing
Collaborations with industry leaders have led us to develop new measurement techniques to improve our understanding thermal transport, spin transport, and nanoscopic (and interfacial) material properties in active device structures. Such capability requires the ability to measure these properties at

Publications

GRANAD - Simulating GRAphene nanoflakes with ADatoms

Author(s)
David Dams, Miriam Kosik, Marvin Muller, Abhishek Ghosh, Antton Babaze, Julia Szczuczko, Garnett Bryant, Andres Ayuela, Carsten Rockstuhl, Marta Pelc, Karolina Slowik
GRANAD is a new program based on the tight-binding approximation to simulate optoelectronic properties of graphene nanoflakes and Su–Schrieffer–Heeger (SSH)

Software

MOSAIC

MOSAIC is a modular single-molecule analysis toolbox to decode multi-state single-molecule and nanopore time-series data. Read the documentation for additional

Tools and Instruments

Precision Imaging Facility

The Precision Imaging Facility (PIF) is a cooperative research facility at the National Institute of Standards and Technology (NIST) dedicated to the
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