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NIST Interagency/Internal Report (NISTIR)

Sensor-Driven Fire Model Version 1.1 (NISTIR 6705)

January 1, 2001

Author(s)

William D. Davis, Glenn P. Forney

Modern building fire sensors are capable of supplying substantially more information to the fire service than just the simple detection of a possible fire. With...

Opto-mechanical and electronic design of a tunnel-trap Si-radiometer

January 1, 2001

Author(s)

George P. Eppeldauer, D C. Lynch

Use of Fluorescence to Measure the Lubricant Excess Surface Density During Pool Boiling

January 1, 2001

Author(s)

Mark A. Kedzierski

This paper presents what are believed to be the first measurements of the non-adiabatic lubricant excess surface density on a roughened, horizontal flat pool...

Input Data for Multizone Airflow and IAQ Analysis

January 1, 2001

Author(s)

Andrew K. Persily, E M. Ivy

The use of multizone airflow and contaminant dispersal models requires a range of data. In terms of airflow analysis, these data include leakage characteristics...

Radio-Frequency Technology Division: Programs, Activities and Accomplishments

January 1, 2001

Author(s)

Dennis S. Friday, Robert M. Judish

NIST Combinatorial Methods Center, JUL, 2001: Meeting Proceedings.

January 1, 2001

Author(s)

A Sehgal, Alamgir Karim, Eric J. Amis

Polymers Division 2000 Programs and Accomplishments

January 1, 2001

Author(s)

Eric J. Amis, B M. Fanconi

The programs and accomplishments of the NIST Polymers Division for the fiscal year 2000 are described.

NIST Frequency Measurement and Analysis System: Operator's Manual

January 1, 2001

Author(s)

Michael A. Lombardi

Technical Reference Manual for NIST Automated Computer Time Service (ACTS)

January 1, 2001

Author(s)

Judah Levine, Michael A. Lombardi, L M. Nelson, Victor S. Zhang

NIST Response to the 6th CORM Report: Pressing Problems and Projected National Needs in Optical Radiometry,

January 1, 2001

Author(s)

Keith R. Lykke, Gerald T. Fraser, Albert C. Parr

NIST Response to the 6th CORM Report: Pressing Problems and Projected National Needs in Optical Radiometry

January 1, 2001

Author(s)

Keith R. Lykke, Gerald T. Fraser, Albert C. Parr

Therapeutic and Drug Delivery Devices

January 1, 2001

Author(s)

Lisa R. Karam, M Coursey b

Perspectives on the Needs for Biomedical Materials and Device Standards

January 1, 2001

Author(s)

Lisa R. Karam, D S. Hall, J A. Tesk

Thermal Spray Process Reliability: Sensors and Diagnostics; Summary of a Workshop held at National Institute of Standards and Technology

January 1, 2001

Author(s)

Stephen D. Ridder

This report covers the second workshop on TS coatings sponsored by the NIST Metallurgy Division. The first of these workshops, held in November, 1998, is...

Metallurgy Division 2000 Programs and Accomplishments

January 1, 2001

Author(s)

C A. Handwerker, Robert J. Schaefer

This report describes major programs and accomplishments of the Metallurgy Division of the NIST Materials Science and Engineering Laboratory (MSEL) in FY2000...

Materials Reliability Division FY 2000 Programs and Accomplishments

January 1, 2001

Author(s)

F R. Fickett

The technical activities of the Materials Reliability Division during fiscal year 2000 are summarized. The Division has 23 research projects in the following...

Ceramics Division FY 2000 Programs and Accomplishments

January 1, 2001

Author(s)

Stephen W. Freiman, S J. Dapkunas

The mission of the Ceramics Division is: Work with industry, standards bodies, academia, and other government agencies in providing the leadership for the...

Combinatorial Methods at NIST

January 1, 2001

Author(s)

Alamgir Karim, Eric J. Amis

New, more complex materials are increasingly in demand for applications in biotechnology, microelectronics and nanotechnology. The use of combinatorial methods...

Workshop on Temperature Measurement of Semiconductor Wafers Using Thermocouples

January 1, 2001

Author(s)

Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, B Lojek

Temperature measurement is an important parameter in most semiconductor processes. These measurements are necessary in temperature ranges as low as below 0 C in...

Semiconductor Electronics Division Programs, Activities, and Accomplishments 2000

January 1, 2001

Author(s)

Erik M. Secula

This document represents the fiscal year 2000 production of the Projects comprising the Semiconductor Electronics Division (SED). Project goals, customer needs...

Office of Law Enforcement Standards - Programs, Activities, and Accomplishments

January 1, 2001

Author(s)

Thomas J. Russell

The Office of Law Enforcements (OLES) of the National Institute of Standards and Technology (NIST) helps law enforcement and criminal justice agencies ensure...

Acceptance of new batches of 9310 steel for the Charpy Machine Verification Program

January 1, 2001

Author(s)

May Ling Martin, Enrico Lucon

During FY2021, one of the NIST Charpy Contractors returned some 9310 steel blanks (rough-machined, oversized, unnotched specimens) that presented visible black...

Computational and Performance Aspects of PCA-Based Face Recognition Algorithms

January 1, 2001

Author(s)

H Moon, P. Jonathon Phillips

Principal component analysis (PCA) based algorithms form the basis of numerous algorithms and studies in the psychological and algorithmic face recognition...

Rationale and Procedures for Development of a NASA Primary Metrology Laboratory for Large Optics

January 1, 2001

Author(s)

Theodore V. Vorburger, Christopher J. Evans, William T. Estler

Traceable optics metrology is not an expensive overhead. Rather it can improve NASA''s procurement process and eliminate costly Hubble-like mistakes. In...

NIST Centenial Sessions August Second Two Thousand and One

January 1, 2001

Author(s)

W Anderson, Dennis A. Swyt, H Semerjian

The National Conference of Standards Laboratories International was formed in forty years ago (as NCSL) to promote cooperative efforts for solving the common...

Wafer Level Underfill: Experiments and Modeling.

January 1, 2001

Author(s)

Daniel Josell, William E. Wallace, Daniel Wheeler

MSIDs Continuous Improvement Activities

January 1, 2001

Author(s)

Sharon J. Kemmerer, Kristy D. Thompson

The purpose of this document is to provide status on two continuous improvement projects internal to the National Institute of Standards and Technology (NIST)...

Office of Microelectronics Programs Technical Accomplishments

January 1, 2001

Author(s)

Stephen Knight, Barbara J. Belzer

This document represents the fiscal year 2000 production of the Programs comprising the Office of Microelectronics Programs (OMP).

Electronics and Electrical Engineering Laboratory, Magnetics Group: Programs, Activities, and Accomplishments

December 31, 2000

Author(s)

Ronald B. Goldfarb

Report of the NIST MEL Architecture Task Force

December 29, 2000

Author(s)

Harry A. Scott, John Evans, Steven R. Ray, E C. Teague, James S. Albus, Herbert T. Bandy, Edward J. Barkmeyer Jr., Neil Christopher, M A. Donmez, Hui-Min Huang, Albert W. Jones, Elena R. Messina, Jim G. Nell, Frederick M. Proctor, Evan K. Wallace

The NIST Manufacturing Engineering Laboratory undertook a series of internal working meetings to examine all of its architecture efforts. A survey of work was...

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