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The NAMT program is currently underway at the National Institute of Standards and Technology (NIST). The NAMT was initiated by the Manufacturing Engineering...
The Electronics and Electrical Engineering Laboratory (EEEL) promotes U.S. economic growth by providing measurement capability of high impact focused primarily...
This report summarizes the research and services provided by the Chemical Science and Technology Laboratory of the National Institute of Standards and...
The Systems Integration for Manufacturing Applications (SIMA) Program is an intramural effort underway at the National Institute of Standards and Technology...
Most people are surprised to learn of the complexities of measuring the performance of electronic displays. Serious errors are encountered in even seemingly...
This paper describes the initiation of our project to study three-dimensional navigation through manufacturing knowledge domains suitable for training. In...
Modern building fire sensors are capable of supplying substantially more information to the fire service than just the simple detection of a possible fire. With...
This paper presents what are believed to be the first measurements of the non-adiabatic lubricant excess surface density on a roughened, horizontal flat pool...
The use of multizone airflow and contaminant dispersal models requires a range of data. In terms of airflow analysis, these data include leakage characteristics...
This report covers the second workshop on TS coatings sponsored by the NIST Metallurgy Division. The first of these workshops, held in November, 1998, is...
This report describes major programs and accomplishments of the Metallurgy Division of the NIST Materials Science and Engineering Laboratory (MSEL) in FY2000...
The technical activities of the Materials Reliability Division during fiscal year 2000 are summarized. The Division has 23 research projects in the following...
The mission of the Ceramics Division is: Work with industry, standards bodies, academia, and other government agencies in providing the leadership for the...
New, more complex materials are increasingly in demand for applications in biotechnology, microelectronics and nanotechnology. The use of combinatorial methods...
Kenneth G. Kreider, D P. DeWitt, Benjamin K. Tsai, B Lojek
Temperature measurement is an important parameter in most semiconductor processes. These measurements are necessary in temperature ranges as low as below 0 C in...
This document represents the fiscal year 2000 production of the Projects comprising the Semiconductor Electronics Division (SED). Project goals, customer needs...
The Office of Law Enforcements (OLES) of the National Institute of Standards and Technology (NIST) helps law enforcement and criminal justice agencies ensure...
During FY2021, one of the NIST Charpy Contractors returned some 9310 steel blanks (rough-machined, oversized, unnotched specimens) that presented visible black...
Principal component analysis (PCA) based algorithms form the basis of numerous algorithms and studies in the psychological and algorithmic face recognition...
Theodore V. Vorburger, Christopher J. Evans, William T. Estler
Traceable optics metrology is not an expensive overhead. Rather it can improve NASA''s procurement process and eliminate costly Hubble-like mistakes. In...