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Impediments to Reproducibility in Display Metrology

Published

Author(s)

Edward F. Kelley

Abstract

Most people are surprised to learn of the complexities of measuring the performance of electronic displays. Serious errors are encountered in even seemingly simple measurements if we blithely measure displays without being aware of the pitfalls. We discuss the nefarious veiling glare, the measurment of resolution, the remarkable complications found in reflection measurements, and other surprises that affect reproducibility of the measurements.
Citation
NIST Interagency/Internal Report (NISTIR) - 6591
Report Number
6591

Keywords

display measurements, display metrology, display reflection measurements, resolution measurements, veiling glare

Citation

Kelley, E. (2001), Impediments to Reproducibility in Display Metrology, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6591 (Accessed February 26, 2024)
Created January 11, 2001, Updated January 27, 2020