Kelley, E.
(2001),
Impediments to Reproducibility in Display Metrology, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6591
(Accessed October 15, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Impediments to Reproducibility in Display Metrology
Published
Author(s)
Abstract
Most people are surprised to learn of the complexities of measuring the performance of electronic displays. Serious errors are encountered in even seemingly simple measurements if we blithely measure displays without being aware of the pitfalls. We discuss the nefarious veiling glare, the measurment of resolution, the remarkable complications found in reflection measurements, and other surprises that affect reproducibility of the measurements.Citation
NIST Interagency/Internal Report (NISTIR) - 6591
Report Number
6591
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
display measurements, display metrology, display reflection measurements, resolution measurements, veiling glare
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created January 11, 2001, Updated January 27, 2020