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NIST Interagency/Internal Report (NISTIR)

Visualization of Structural Behavior under Fire

Author(s)
Dilip K. Banerjee, William J. Hess, Thomas M. Olano, Judith E. Terrill, John L. Gross
An integrated environment was created to study the interaction among fire, heat transfer, and structural deformation from a typical room fire. The fire, thermal

Symbol Representing Biometrics in Use

Author(s)
Yee-Yin Choong, Mary Theofanos, Brian Stanton
During the InterNational Committee for Information Technology Standards (INCITS) M1 task group meetings in 2008, it was recognized that there is a need for a

Overview of the Multiple Biometrics Grand Challenge

Author(s)
P J. Phillips, Patrick J. Flynn, J. R. Beveridge, Kevin W. Bowyer, W T. Scruggs, Alice O'Toole, David Bolme, Bruce A. Draper, Geof H. Givens, Yui M. Lui, Hassan A. Sahibzada, Joseph A. Scallan, Samuel Weimer
The goal of the Multiple Biometrics Grand Challenge (MBGC) is to improve the performance of face and iris recognition technology from biometric samples acquired

Estimating Volumes of Simulated Lung Cancer Nodules

Author(s)
David E. Gilsinn, Bruce R. Borchardt, Amelia Tebbe
Lung cancer is a disease of uncontrolled cell growth in tissues of the lung. Computed tomography (CT) shows promise in detecting lung cancers at earlier, more

Semiconductor Microelectronics and Nanoelectronics Programs

Author(s)
Joaquin (. Martinez, Yaw S. Obeng, Michele L. Buckley
The microelectronics industry supplies vital components to the electronics industry and to the U.S. economy, enabling repaid improvements in productivity and in

Report of Findings: Use of Language in Ballot Instructions

Author(s)
Janice G. Redish, Dana Chisnell, Ethan Newby, Sharon J. Laskowski, Svetlana Z. Lowry
In this study, we compared two ballots that differed only in wording and presentation of the language on the ballots. For Ballot A, we used conventional wording

OntoSTEP: OWL-DL Ontology for STEP

Author(s)
Sylvere Krima, Raphael Barbau, Xenia Fiorentini, Sudarsan Rachuri, Ram D. Sriram
The Standard for the Exchange of Product model data (STEP) [1] contains product information mainly related to geometry. The modeling language used to develop

Software Assurance Using Structured Assurance Case Models

Author(s)
Thomas R. Rhodes, Frederick E. Boland Jr., Elizabeth N. Fong, Michael J. Kass
Software assurance is an important part of the software development process to reduce risks and ensure that the software is dependable and trustworthy. Software

Directions in Security Metrics Research

Author(s)
Wayne Jansen
More than 100 years ago, Lord Kelvin insightfully observed that measurement is vital to deep knowledge and understanding in physical science. During the last

Super-Resolution Enhancement of Flash LADAR Range Data

Author(s)
Gavin Rosenbush, Tsai H. Hong, Roger D. Eastman
Flash LADAR systems are becoming increasingly popular for robotics applications. However, they generally provide a low-resolution range image because of the

Markov Chain Analysis for Large-Scale Grid Systems

Author(s)
Christopher E. Dabrowski, Fern Y. Hunt
In large-scale grid systems with decentralized control, the interactions of many service providers and consumers will likely lead to emergent global system

Evaluation of Oral Fluid Testing Devices

Author(s)
Lorna T. Sniegoski, Jocelyn L. Prendergast, Michael J. Welch, Alim A. Fatah, M Gackstetter, R. Q. Thompson
Several point-of-collection (POC) devices for detection of drugs of abuse in oral fluid were studied. The ability of the devices to meet the manufacturers'

EEEL Technical Accomplishments

Author(s)
Erik M. Secula
This document describes the technical work of the Electronics and Electrical Engineering Laboratory. In this report, you will find that EEEL researchers are

Computer Security Division 2008 Annual Report

Author(s)
Patrick D. O'Reilly
This annual report covers the work conducted within the National Institute of Standards and Technology's Computer Security Division during Fiscal Year 2008. It

Manufacturing Interoperability Program, a Synopsis

Author(s)
Sharon J. Kemmerer
Started in 2005, the Manufacturing Interoperability Program has seen an investment of roughly 25-30 full-time staff who have researched, developed, and deployed
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