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Proceedings of the Dynamic Measurement and Control for Autonomous Manufacturing Workshop

Published

Author(s)

Tsai H. Hong, Roger D. Eastman, Roger V. Bostelman, Hui-Min Huang, B. McMorris

Abstract

The Dynamic Measurement workshop was held on October 10 - 11, 2007 at the Columbia Graduate Center of Loyola College in Maryland. Forty-eight people attended the one-day-and-a-half event which was moderated by Roger Bostelman and Tsai Hong of National Institute of Standards and Technology (NIST) with assistance from Roger Eastman of Loyola and cosponsored by Brian McMorris of SICK, Inc. Attendees included manufacturers of general assembly equipment, robotic arms and autonomously guided vehicles, and machine vision and three-dimensional (3D) sensors, system integrators, government representatives from NIST and National Science Foundation (NSF), and academics with research specialties in computer vision and robotics.
Citation
NIST Interagency/Internal Report (NISTIR) -

Keywords

autonomously guided vehicles (AGVs), assembly line, degrees of freedom (DOF), dynamic metrology, machine vision, manufacturing, measurement, perception, three-dimensional (3D)

Citation

Hong, T. , Eastman, R. , Bostelman, R. , Huang, H. and McMorris, B. (2009), Proceedings of the Dynamic Measurement and Control for Autonomous Manufacturing Workshop, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=824737 (Accessed April 18, 2024)
Created May 28, 2009, Updated October 12, 2021