An Evaluation of Automated Latent Fingerprint Identification Technology (Phase II)
Michael D. Indovina, Vladimir N. Dvornychenko, Elham Tabassi, George W. Quinn, Patrick J. Grother, Stephen Meagher, Michael D. Garris
The National Institute of Standards and Technology (NIST), with the cooperation of eight technology providers, performed a test of accuracy for searching latent fingerprints when using automatically extracted features and matching (AFEM). This test is Phase II of the Evaluation of Latent Fingerprint Technology (ELFT) project. The test was open to both the commercial and academic community, and participants included vendors of Automated Fingerprint Identification Systems (AFIS). This report provides the design, process, assumptions, limitations, results, observations and conclusions of the test.