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An Evaluation of Automated Latent Fingerprint Identification Technology (Phase II)



Michael D. Indovina, Vladimir N. Dvornychenko, Elham Tabassi, George W. Quinn, Patrick J. Grother, Stephen Meagher, Michael D. Garris


The National Institute of Standards and Technology (NIST), with the cooperation of eight technology providers, performed a test of accuracy for searching latent fingerprints when using automatically extracted features and matching (AFEM). This test is Phase II of the Evaluation of Latent Fingerprint Technology (ELFT) project. The test was open to both the commercial and academic community, and participants included vendors of Automated Fingerprint Identification Systems (AFIS). This report provides the design, process, assumptions, limitations, results, observations and conclusions of the test.
NIST Interagency/Internal Report (NISTIR) - 7577
Report Number


fingerprints, latent fingerprint, fingerprint matchers, automated matchers, lights-out, ELFT, Phase II, matcher performance


Indovina, M. , Dvornychenko, V. , Tabassi, E. , Quinn, G. , Grother, P. , Meagher, S. and Garris, M. (2009), An Evaluation of Automated Latent Fingerprint Identification Technology (Phase II), NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], (Accessed May 21, 2024)


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Created April 2, 2009, Updated February 19, 2017