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Nanotechnology

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This FIB Doesn't Lie: New NIST Microscope Sees What Others Can't

May 6, 2014

Microscopes don't exactly lie, but their limitations affect the truths they can tell. For example, when operated in their most typical high-energy modes

Now You See It: Electromagnetically Induced Transparency in a Silicon Nitride Optomechanical Crystal

April 9, 2014

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) have observed electromagnetically induced transparency at room temperature and

No Compromises: JILA's Short, Flexible, Reusable AFM Probe

April 8, 2014

JILA researchers have engineered a short, flexible, reusable probe for the atomic force microscope (AFM) that enables state-of-the-art precision and stability

PML Scientists Develop 3D SEM Metrology for 10 nm Structures

March 21, 2014

PML researchers have devised an idea for determining the three-dimensional shape of features as small as 10 nanometers wide. The model-based method compares

Schematic showing metal-organic framework materials on a surface. Their expansion, which is induced by an infrared laser, is detected using the tip of an atomic force microscope.

Looking Inside: Assessing the Chemical Composition of a Metal-Organic Framework with Nanoscale Resolution

March 11, 2014

Researchers from the NIST Center for Nanoscale Science and Technology (CNST), in collaboration with researchers from University of Lyon, France, have applied a

Sample Deposit on Piezoelectric Quartz Crystals

NIST Microanalysis Technique Makes the Most of Small Nanoparticle Samples

February 24, 2014

Researchers from the National Institute of Standards and Technology (NIST) and the Food and Drug Administration (FDA) have demonstrated that they can make

CNST Deputy Director Lloyd Whitman Serving as Interim Director of the National Nanotechnology Coordination Office

February 12, 2014

Lloyd Whitman, Deputy Director of the NIST Center for Nanoscale Science and Technology (CNST), has been detailed to the National Science and Technology Council

Researchers Develop Framework for Understanding Current-Switched Magnetic Devices

February 5, 2014

An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology (CNST) has made significant progress in modelling

Schematic showing an input signal at 980 nm frequency shifted to the 1550 nm wavelength band through the application of two strong pump lasers.

A Frequency Conversion Interface to the Telecommunications Band Using Nanophotonics

December 17, 2013

Using nanofabricated waveguides in a silicon-based platform, researchers from the NIST Center for Nanoscale Science and Technology (CNST) have developed a

Steve Blankenship Wins AVS George T. Hanyo Award for Outstanding Performance in Technical Support of Research

December 16, 2013

Steve Blankenship, an Instrumentation Specialist in the NIST Center for Nanoscale Science and Technology (CNST), has been awarded the 2013 George T. Hanyo Award

Electron beam induced current (red) superimposed on a scanning electron micrograph (gray). Bright contrast in the vicinity of grain boundaries indicates that these regions have higher carrier collection efficiency than the grain interiors.

Characterizing Solar Cells with Nanoscale Precision Using a Low-Energy Electron Beam

December 4, 2013

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) have demonstrated a new low energy electron beam technique and used it to probe the

The NIST Center for Nanoscale Science and Technology Develops and Deploys New NanoFab Management System

November 18, 2013

The Center for Nanoscale Science and Technology (CNST), NIST's nanotechnology user facility, has deployed a new laboratory equipment management system which it

CNST Releases the Fall 2013 Edition of The CNST News

November 14, 2013

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Fall 2013 edition of The CNST News. This quarterly

Thermopower image of epitaxial graphene. Three distinct indexed regions are marked l, ll, and lll.

Researchers from U.S. and Korea Collaborate on Graphene Research

November 7, 2013

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) and the Republic of Korea's national metrology institute—the Korea Research

Perfect Faults: A Self-Correcting Crystal May Unleash the Next Generation of Advanced Communications

November 5, 2013

Researchers from the National Institute of Standards and Technology (NIST) have joined with an international team to engineer and measure a potentially

The NIST Center for Nanoscale Science and Technology Launches Updated NanoFab Website

October 28, 2013

The Center for Nanoscale Science and Technology (CNST), NIST's nanotechnology user facility, is pleased to announce a major update to the NanoFab website. The

The Reins of Casimir: Engineered Nanostructures Could Offer Way to Control Quantum Effect ... Once a Mystery Is Solved

October 22, 2013

You might think that a pair of parallel plates hanging motionless in a vacuum just a fraction of a micrometer away from each other would be like strangers

CNST Physicists Kevin Twedt and Vladimir Aksyuk

NIST Center for Nanoscale Science and Technology Researchers Introduce Blind Students to Nanoscale Science

September 19, 2013

In July 2013, 45 blind and visually impaired high school students from around the country gathered at Towson University for a weeklong event designed to expose

The Persistence of Memory: Looking into MRAM

August 5, 2013

Many in the electronics industry want to change how memories are made. So PML scientists are exploring the physics and developing the metrology required to do

New Nanoscale Imaging Method Finds Application in Plasmonics

July 16, 2013

Researchers from the National Institute of Standards and Technology (NIST) and the University of Maryland have shown how to make nanoscale measurements of

CNST News Spring/Summer 2013 cover - web

CNST Releases the Spring/Summer 2013 Edition of The CNST News

July 1, 2013

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Winter 2013 edition of The CNST News. This quarterly

Promoting Nanomaterial Manufacturing by Characterizing and Minimizing Environmental Risks

June 26, 2013

While nanomaterials have led to major advances in key U.S. industries, especially the semiconductor industry, their technological promises and possibilities are

Illustration of a new microscopy technique that works by scanning a beam of electrons over a sample that has been coated with specially engineered quantum dots.

New Quantum Dot Technique Combines Best of Optical and Electron Microscopy

June 12, 2013

It's not reruns of "The Jetsons", but researchers working at the National Institute of Standards and Technology (NIST) have developed a new microscopy technique

CNST Hosts Workshop on In Situ Measurements using Transmission Electron Microscopy

June 6, 2013

On April 11 and 12, 2013, the NIST Center for Nanoscale Science and Technology(CNST) hosted a workshop on "Frontiers of In Situ Transmission Electron Microscopy

A NIST team has created an ultraviolet (UV) metamaterial formed of alternating nanolayers of silver (green) and titanium dioxide (blue)

The Better to See You With: Scientists Build Record-Setting Metamaterial Flat Lens

May 23, 2013

For the first time, scientists working at the National Institute of Standards and Technology (NIST) have demonstrated a new type of lens that bends and focuses

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