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Electronics

News and Updates

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NIST Team Proves Bridge from Conventional to Molecular Electronics Possible

March 18, 2008

Researchers at the National Institute of Standards and Technology (NIST) have set the stage for building the "evolutionary link" between the microelectronics of...

Good Vibrations Probe Innards of Molecular Electronic Junctions

March 5, 2008

Using an unusual spectroscopic technique, researchers at the National Institute of Standards and Technology (NIST) have provided the most convincing evidence...

Directed Self-Ordering of Organic Molecules for Electronic Devices

February 19, 2008

A simple surface treatment technique demonstrated by a collaboration between researchers at the National Institute of Standards and Technology (NIST), Penn...

Man wearing a white protective coverall, hood, gloves and face mask, holds a round, purple, sample of a silicon wafer and presses buttons on a white instrument panel.

Measurement Innovations Add Up to Big Savings for Semiconductors

January 8, 2008

A new report from the National Institute of Standards and Technology (NIST) shows that investment in measurement science has and will continue to have a...

Photograph of the NIST micro microwave oven

Micro Microwave Does Pinpoint Cooking for Miniaturized Labs

November 8, 2007

Researchers at the National Institute of Standards and Technology (NIST) and George Mason University have demonstrated what is probably the world's smallest...

NIST Presents Its Microfluidics Technologies For Commercial Adoption

October 12, 2007

A TECHNOLOGY TRANSFER AND FEDERAL MARKETPLACE EVENT NIST Presents Its Microfluidics Technologies For Commercial Adoption On Tuesday, October 9, 2007, NIST...

illustration of NIST's modified field-effect transistor

New Quantum Dot Transistor Counts Individual Photons

October 11, 2007

A transistor containing quantum dots that can count individual photons (the smallest particles of light) has been designed and demonstrated at the National...

NIST Laser-Based Method Cleans Up Grubby Nanotubes

December 21, 2006

Before carbon nanotubes can fulfill their promise as ultrastrong fibers, electrical wires in molecular devices, or hydrogen storage components for fuel cells...

NIST Releases New Standard for Semiconductor Industry

October 12, 2006

A wide range of optical electronic devices, from laser disk players to traffic lights, may be improved in the future thanks to a small piece of semiconductor...

Researchers Peg Magnetism as Key Driver of High-Temperature Superconductivity

July 6, 2006

GAITHERSBURG, Md.—When it comes to superconductivity, magnetic excitations may top good vibrations. Writing in the July 6, 2006, issue of Nature, scientists...

Noise Measurement May Boost Cell Phone Performance

June 22, 2006

Researchers at the National Institute of Standards and Technology (NIST) and industry collaborators have developed improved methods for accurately measuring...

Circuit Board Materials May Like It Hot (or Not)

June 8, 2006

Electrical circuits may act differently in Arizona than they do in Alaska—potentially affecting the performance of computers and other electronics. A new...

colorized micrograph of three tunable gates

New Design for Transistors Powered by Single Electrons

February 2, 2006

Scientists have demonstrated the first reproducible, controllable silicon transistors that are turned on and off by the motion of individual electrons. The...

Simulation Program Predicts Resistivity in Nanodevices

January 17, 2006

As nanoscale circuits continue to shrink, electrical resistivity increases in the wiring and limits the maximum circuit speed. A new simulation program...

The NIST "transition-edge sensor" is made of layers of molybdenum and copper with a coating of bismuth to increase the X-ray stopping power.

Copper Ridges Nearly Double X-ray Sensor Performance

November 17, 2005

A series of copper ridges nearly doubles the resolution of experimental X-ray sensors, enabling more precise identification of the X-ray "fingerprints" of...

Evaluation Gauges Results from Machine Translation

August 26, 2005

The National Institute of Stanards and Technology has posted the results of the NIST 2005 Machine Translation Evaluation (MT-05), part of an ongoing series...

Reference Materials Planned for Semiconductor Industry

June 30, 2005

Companies and research organizations are invited to collaborate with the National Institute of Standards and Technology (NIST) and SEMATECH in the development...

Micrograph of four NIST single photon detectors

NIST Photon Detectors Have Record Efficiency

June 2, 2005

Sensors that detect and count single photons, the smallest quantities of light, with 88 percent efficiency have been demonstrated by physicists at the National...

colorized scanning electron micrograph shows a cube of germanium attached to a membrane.

Chip-scale Refrigerators Cool Bulk Objects

April 21, 2005

Chip-scale refrigerators capable of reaching temperatures as low as 100 milliKelvin have been used to cool bulk objects for the first time, researchers at the...

A NIST-developed, carbon nanotube-coated pyroelectric detector that may improve thermal conductivity and resistance to laser damage.

Laser Applications Heat Up for Carbon Nanotubes

January 26, 2005

Carbon nanotubes—a hot nanotechnology with many potential uses—may find one of its quickest applications in the next generation of standards for optical power...

A Quantum Mechanical 'Tune Up' for Better Measurement

June 4, 2004

By exploiting the weird quantum behavior of atoms, physicists at the Commerce Department's National Institute of Standards and Technology (NIST) have...

Novel Zigzag Shape Gives Sensors Magnetic Appeal

August 27, 2003

Scientists at the National Institute of Standards and Technology (NIST) have designed tiny magnetic sensors in a "zigzag" shape that are simpler in design and...

NIST Team Reports Method to Characterize New Insulating Materials for Microelectronics

August 20, 2002

Researchers from the Commerce Department's National Institute of Standards and Technology (NIST) reported today they have developed methods for characterizing...

Public/Private Advance Focuses the Search for New Materials to Print Next-Generation Microchips

July 19, 2002

New methods reported today by researchers from the Commerce Department's National Institute of Standards and Technology (NIST), the IBM T.J. Watson Research...

New e-Handbook of Statistical Methods Available Online from NIST

June 15, 2002

The Commerce Department's National Institute of Standards and Technology (NIST) and International SEMATECH (ISMT) announced today the new NIST/Sematech e...

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NIST Headquarters
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---Biosystems and Biomaterials Division
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