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Electronics

News and Updates

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EEEL and ITL Researchers Develop New Uncertainty Analysis for Pulse Parameters

July 1, 2009

Oscilloscopes are routinely used to measure the properties of a wide variety of pulsed waveforms, including digital data streams in computers and in electrical...

Electron microscope image of two superconducting thin films that meet at a 6 degree tilt boundary

NIST Discovers How Strain at Grain Boundaries Suppresses High-Temperature Superconductivity

June 16, 2009

Researchers at the National Institute of Standards and Technology (NIST) have discovered that a reduction in mechanical strain at the boundaries of crystal...

Nanosoccer Robots Ready to Compete in Upcoming RoboCup Games

June 16, 2009

The National Institute of Standards and Technology (NIST) will be serving up "soccer under glass" - the glass of a microscope lens - when nanosoccer makes its...

Memory with a Twist: NIST Develops a Flexible Memristor

June 2, 2009

Electronic memory chips may soon gain the ability to bend and twist as a result of work by engineers at the National Institute of Standards and Technology (NIST...

NIST's LIDAR May Offer Peerless Precision in Remote Measurements

June 2, 2009

By combining the best of two different distance measurement approaches with a super-accurate technology called an optical frequency comb, researchers at the...

EEEL Measures High-Order Coherences of Chaotic and Coherent Light

June 1, 2009

Researchers in the Optoelectronics Division of EEEL, in collaboration with colleagues at MIT and MIT Lincoln Laboratory, have demonstrated a new way to measure...

NIST Engineers Discover Fundamental Flaw in Transistor Noise Theory

May 20, 2009

Chip manufacturers beware: There's a newfound flaw in our understanding of transistor noise, a phenomenon affecting the electronic on-off switch that makes...

NIST Helping Improve Speed Measurements for Cars, Bullets

May 20, 2009

While today's law enforcement officers don't wear utility belts full of crimefighting gadgets like Batman, they do rely on a variety of state-of-the-art...

New Nanotube Coating Enables Novel Laser Power Meter

May 5, 2009

The U.S. military can now calibrate high-power laser systems, such as those intended to defuse unexploded mines, more quickly and easily thanks to a novel...

Conference Offers Insight Into Exploration of Nano-sized Electronics

April 21, 2009

New methods for exploring the behavior of the high-performance electronics materials and devices that will shape the future of the electronics industry will be...

Vibrationally Robust Fiber Laser Frequency Comb

April 1, 2009

Optical frequency combs have been vigorously developed over the past seven years at NIST and elsewhere. They provide a uniquely broadband and coherent optical...

New Program Evaluates Labs for Emergency Communications Tests

March 24, 2009

To help ensure that first responders, public safety officers and military personnel can always talk with each other no matter what communications equipment they...

Random Antenna Arrays Boost Emergency Communications

February 24, 2009

First responders could boost their radio communications quickly at a disaster site by setting out just four extra transmitters in a random arrangement to...

Conference to Focus on Anti-Counterfeiting, Consumer Protection

February 10, 2009

Representatives from business and government agencies concerned with intellectual property rights, particularly those concerning electronic devices, will gather...

NIST researchers have developed a new technique to form nanotubes for use in gas sensing applications.

Super Sensitive Gas Detector Goes Down the Nanotubes

January 13, 2009

When cells are under stress, they blow off steam by releasing minute amounts of nitrogen oxides and other toxic gases. In a recent paper, researchers at the...

Guest researcher John Jendzurski prepares the NIST electromagnetic phantom for passage through the walk-through metal detector behind it.

Electromagnetic Phantom Exorcises Specters of Metal Detector Tests

December 23, 2008

In the comics, the Phantom is a masked crimefighter who protected the innocent from pirates, hijackers and other evildoers. While not as dashing or exciting as...

Typical low-k film test for material toughness using the new NIST technique.

Cracking a Tough Nut for the Semiconductor Industry

December 23, 2008

Researchers at the National Institute of Standards and Technology (NIST) have developed a method to measure the toughness—the resistance to fracture—of the thin...

Steady-state and time-resolved photoluminescence from relaxed and strained GaN nanowires grown by catalyst-free molecular-beam epitaxy

December 1, 2008

Gallium nitride (GaN)-based semiconductors have successfully been incorporated into commercial light emitting diodes and commercial laser diodes that operate...