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Electronics

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EEEL Researchers Develop Novel Attenuator for High-energy Lasers

June 2, 2008

A laser attenuator having a well-known and stable attenuation can extend the usefulness of an optical power meter for laser radiometry. The challenge of

Artist rendition of a tiny robot approaching a malfunctioning red blood cell

Learn About 'NIST and Nanosoccer' from New Web Site and Video

May 28, 2008

If you love soccer but don't want to wait until the next World Cup in 2010 to satisfy your appetite for the most popular game on Earth, the National Institute

NIST Staff Honored for Technology Transfer

May 28, 2008

John Lehman, Chris Cromer and Xiaoyu Li of the National Institute of Standards and Technology (NIST) have received a 2008 Award for Excellence in Technology

Electron micrograph shows a cross-section of a typical SOG microcircuit feature.

Making a Good Impression: Nanoimprint Lithography Tests at NIST

April 29, 2008

In what should be good news for integrated circuit manufacturers, recent studies by the National Institute of Standards and Technology (NIST) have helped

The NIST terahertz imaging system reveals slight temperature differences, as shown in this post-processed image.

Prototype Terahertz Imager Promises Biochem Advances

April 15, 2008

Researchers at the National Institute of Standards and Technology (NIST) have demonstrated a new imaging system that detects naturally occurring terahertz

Colorized micrograph of a NIST chip combining four micro-refrigerators with a superconducting sensor

NIST Micro Sensor and Micro Fridge Make Cool Pair

April 15, 2008

Researchers at the National Institute of Standards and Technology (NIST) have combined two tiny but powerful NIST inventions on a single microchip, a cryogenic

NIST Team Proves Bridge from Conventional to Molecular Electronics Possible

March 18, 2008

Researchers at the National Institute of Standards and Technology (NIST) have set the stage for building the "evolutionary link" between the microelectronics of

NIST Finds 'Metafilms' Can Shrink Radio, Radar Devices

March 18, 2008

Recent research at the National Institute of Standards and Technology (NIST) has demonstrated that thin films made of "metamaterials"—manmade composites

Good Vibrations Probe Innards of Molecular Electronic Junctions

March 5, 2008

Using an unusual spectroscopic technique, researchers at the National Institute of Standards and Technology (NIST) have provided the most convincing evidence

Directed Self-Ordering of Organic Molecules for Electronic Devices

February 19, 2008

A simple surface treatment technique demonstrated by a collaboration between researchers at the National Institute of Standards and Technology (NIST), Penn

Man wearing a white protective coverall, hood, gloves and face mask, holds a round, purple, sample of a silicon wafer and presses buttons on a white instrument panel.

Measurement Innovations Add Up to Big Savings for Semiconductors

January 8, 2008

A new report from the National Institute of Standards and Technology (NIST) shows that investment in measurement science has and will continue to have a

Photograph of the NIST micro microwave oven

Micro Microwave Does Pinpoint Cooking for Miniaturized Labs

November 8, 2007

Researchers at the National Institute of Standards and Technology (NIST) and George Mason University have demonstrated what is probably the world's smallest

NIST Presents Its Microfluidics Technologies For Commercial Adoption

October 12, 2007

A TECHNOLOGY TRANSFER AND FEDERAL MARKETPLACE EVENT NIST Presents Its Microfluidics Technologies For Commercial Adoption On Tuesday, October 9, 2007, NIST

illustration of NIST's modified field-effect transistor

New Quantum Dot Transistor Counts Individual Photons

October 11, 2007

A transistor containing quantum dots that can count individual photons (the smallest particles of light) has been designed and demonstrated at the National

NIST Laser-Based Method Cleans Up Grubby Nanotubes

December 21, 2006

Before carbon nanotubes can fulfill their promise as ultrastrong fibers, electrical wires in molecular devices, or hydrogen storage components for fuel cells

NIST Releases New Standard for Semiconductor Industry

October 12, 2006

A wide range of optical electronic devices, from laser disk players to traffic lights, may be improved in the future thanks to a small piece of semiconductor

Researchers Peg Magnetism as Key Driver of High-Temperature Superconductivity

July 6, 2006

GAITHERSBURG, Md.—When it comes to superconductivity, magnetic excitations may top good vibrations. Writing in the July 6, 2006, issue of Nature, scientists

Noise Measurement May Boost Cell Phone Performance

June 22, 2006

Researchers at the National Institute of Standards and Technology (NIST) and industry collaborators have developed improved methods for accurately measuring

Circuit Board Materials May Like It Hot (or Not)

June 8, 2006

Electrical circuits may act differently in Arizona than they do in Alaska—potentially affecting the performance of computers and other electronics. A new

colorized micrograph of three tunable gates

New Design for Transistors Powered by Single Electrons

February 2, 2006

Scientists have demonstrated the first reproducible, controllable silicon transistors that are turned on and off by the motion of individual electrons. The

Simulation Program Predicts Resistivity in Nanodevices

January 17, 2006

As nanoscale circuits continue to shrink, electrical resistivity increases in the wiring and limits the maximum circuit speed. A new simulation program

The NIST "transition-edge sensor" is made of layers of molybdenum and copper with a coating of bismuth to increase the X-ray stopping power.

Copper Ridges Nearly Double X-ray Sensor Performance

November 17, 2005

A series of copper ridges nearly doubles the resolution of experimental X-ray sensors, enabling more precise identification of the X-ray "fingerprints" of

Evaluation Gauges Results from Machine Translation

August 26, 2005

The National Institute of Stanards and Technology has posted the results of the NIST 2005 Machine Translation Evaluation (MT-05), part of an ongoing series

Reference Materials Planned for Semiconductor Industry

June 30, 2005

Companies and research organizations are invited to collaborate with the National Institute of Standards and Technology (NIST) and SEMATECH in the development

Micrograph of four NIST single photon detectors

NIST Photon Detectors Have Record Efficiency

June 2, 2005

Sensors that detect and count single photons, the smallest quantities of light, with 88 percent efficiency have been demonstrated by physicists at the National

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