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Electronics

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NIST Detector Counts Photons With 99 Percent Efficiency

April 13, 2010

Scientists at the National Institute of Standards and Technology (NIST) have developed the world's most efficient single photon detector, which is able to count...

Diagram of an airbrush technique to create spray-on transistors

Paintable Electronics? NIST Studies Spray-On Manufacturing of Transistors

March 30, 2010

A multidisciplinary research team at the National Institute of Standards and Technology (NIST) has found that an organic semiconductor may be a viable candidate...

This atomic-force microscopy image shows wrinkling in a single-wall carbon nanotube membrane; the inset shows an optical reflection micrograph of the membrane without any strain.

NIST Scientists Address 'Wrinkles' in Transparent Film Development

March 30, 2010

A closer look at a promising nanotube coating that might one day improve solar cells has turned up a few unexpected wrinkles, according to new research...

EEEL Sponsors INTEL VP's Visit to NIST

March 23, 2010

Dr. Michael C. Mayberry, Vice President of the Technology and Manufacturing Group and Director of Components Research at INTEL Corporation, visited NIST in...

Photo of NIST team conducting wireless communication tests in Denver

Call Forwarding: New NIST Procedure Could Speed Cell Phone Testing

March 2, 2010

By accurately re-creating the jumbled wireless signal environment of a city business district in a special indoor test facility, researchers at the National...

Engineered Metamaterials Enable Remarkably Small Antennas

January 26, 2010

In an advance that might interest Q-Branch, the gadget makers for James Bond, the National Institute of Standards and Technology (NIST) and partners from...

Deadline Extended for Entering NIST Microrobotics Challenge

December 15, 2009

An article in the Oct. 20, 2009, issue of NIST Tech Beat, "Is Your Microrobot Up for the (NIST) Challenge?", invited university and collegiate student teams...

Is Your Microrobot Up for the (NIST) Challenge?

October 27, 2009

The scientists and engineers who introduced the world to tiny robots demonstrating soccer skills are creating the next level of friendly competition designed to...

EEEL's New Optical Performance Monitoring of Polarization Impairment in Optical Fiber Communication, Oct 2009

October 22, 2009

High-performance optical fiber networks are susceptible to degradation effects that can change with time. An example of this is polarization-mode dispersion...

New NIST Method Reveals All You Need to Know About 'Waveforms'

October 6, 2009

The National Institute of Standards and Technology (NIST) has unveiled a method for calibrating entire waveforms -- graphical shapes showing how electrical...

EEEL develops all-fiber photon pair Source with Record Low Noise and High Brightness

October 1, 2009

Researchers in the Optoelectronics Division of EEEL have demonstrated an all-fiber photon-pair source with the highest coincidence-to-accidental ratio (CAR)...

NIST Calculations May Improve Temperature Measures for Microfluidics

September 8, 2009

If you wanted to know if your child had a fever or be certain that the roast in the oven was thoroughly cooked, you would, of course, use a thermometer that you...

EEEL and USC Collaboration Applies Artificial Neural Networks to Optical Performance Monitoring

September 1, 2009

High-performance optical networks are susceptible to degrading effects that can change over time. Knowledge of the degradation can be used to diagnose the...

Testing equipment being used by NIST scientists in recent research mapping radio frequency penetration of airframes, in this case a Boeing 737-200.

Penetrating Insights: NIST Airframe Tests Help Ensure Better Shielding for Flight Instruments

August 25, 2009

Airline travelers are used to being instructed to turn off computers and cell phones during takeoffs and landings as a precaution against interfering with the...

Hankering for Molecular Electronics? Grab the New NIST Sandwich

August 25, 2009

The sandwich recipe recently concocted by scientists working at the National Institute of Standards and Technology (NIST) may prove tasty for computer chip...

Novel Temperature Calibration Improves NIST Microhotplate Technology

August 11, 2009

Researchers at the National Institute of Standards and Technology (NIST) have developed a new calibration technique that will improve the reliability and...

EEEL and ITL Researchers Develop New Uncertainty Analysis for Pulse Parameters

July 1, 2009

Oscilloscopes are routinely used to measure the properties of a wide variety of pulsed waveforms, including digital data streams in computers and in electrical...

Electron microscope image of two superconducting thin films that meet at a 6 degree tilt boundary

NIST Discovers How Strain at Grain Boundaries Suppresses High-Temperature Superconductivity

June 16, 2009

Researchers at the National Institute of Standards and Technology (NIST) have discovered that a reduction in mechanical strain at the boundaries of crystal...

Nanosoccer Robots Ready to Compete in Upcoming RoboCup Games

June 16, 2009

The National Institute of Standards and Technology (NIST) will be serving up "soccer under glass" - the glass of a microscope lens - when nanosoccer makes its...

Memory with a Twist: NIST Develops a Flexible Memristor

June 2, 2009

Electronic memory chips may soon gain the ability to bend and twist as a result of work by engineers at the National Institute of Standards and Technology (NIST...

NIST's LIDAR May Offer Peerless Precision in Remote Measurements

June 2, 2009

By combining the best of two different distance measurement approaches with a super-accurate technology called an optical frequency comb, researchers at the...

EEEL Measures High-Order Coherences of Chaotic and Coherent Light

June 1, 2009

Researchers in the Optoelectronics Division of EEEL, in collaboration with colleagues at MIT and MIT Lincoln Laboratory, have demonstrated a new way to measure...

NIST Engineers Discover Fundamental Flaw in Transistor Noise Theory

May 20, 2009

Chip manufacturers beware: There's a newfound flaw in our understanding of transistor noise, a phenomenon affecting the electronic on-off switch that makes...

NIST Helping Improve Speed Measurements for Cars, Bullets

May 20, 2009

While today's law enforcement officers don't wear utility belts full of crimefighting gadgets like Batman, they do rely on a variety of state-of-the-art...

New Nanotube Coating Enables Novel Laser Power Meter

May 5, 2009

The U.S. military can now calibrate high-power laser systems, such as those intended to defuse unexploded mines, more quickly and easily thanks to a novel...

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NIST Headquarters
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---Biosystems and Biomaterials Division
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----Chemical Sciences Division - HQ
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---Applied Physics Division
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--Office of Advanced Manufacturing
---Microelectronics Manufacturing Division
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---Associate Director for Innovation & Industry Services
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