News and Updates

Displaying 1 - 25 of 27

Entering a New Phase: NIST Technique Simultaneously Locates Multiple Defects on Microchip Circuits

November 3, 2022

Defective computer chips are the bane of the semiconductor industry. Even a seemingly minor flaw in a chip packed with billions of electrical connections might

Impeding the Impedance: Research Reveals How to Design a Better Next-Generation Lithium-Ion Battery

November 16, 2021

The newest generation of lithium-ion batteries now under development promises a revolution in powering cell phones, electric vehicles, laptops and myriad other

A Smart Use for Doping: Implanted Atoms Create Unique Electrical IDs That Distinguish Bona Fide Devices From Forgeries

September 16, 2021

If someone sells you a luxury handbag from Paris, France, but it turns out be a forgery from Paris, Texas, the counterfeit item might cost you a thousand bucks

Room Temperature Conversion of CO₂ to CO: A New Way to Synthesize Hydrocarbons

November 2, 2020

Researchers at the National Institute of Standards and Technology (NIST) and their colleagues have demonstrated a room-temperature method that could

NIST Scientists Get Soft on 3D Printing

September 22, 2020

Researchers at the National Institute of Standards and Technology (NIST) have developed a new method of 3D-printing gels and other soft materials. Published in

Researchers Explore Energy-saving Catalysts that Operate at Room Temperature

April 15, 2019

NIST researchers have explored in unprecedented detail a new breed of catalysts that allow some chemical reactions, which normally require high heat, to proceed

After 90 Years, a Better Way to Measure the Composition of Paper

February 14, 2019

Researchers at the National Institute of Standards and Technology (NIST), in collaboration with the U.S. Government Publishing Office (GPO), have developed a

illustration. gray disk. green rods come up from the disk.

Hanging by a Nanowhisker

May 9, 2018

If Alexander Yulaev and his colleagues had their druthers, they’d do away with whiskers altogether. These scientists don’t have anything against facial hair

Two rectangular boxes with oblong shapes in the center of each in red, green and fuscia

Microwave-Based Test Method Can Help Keep 3-D Chip Designers’ Eyes Open

November 28, 2017

Researchers at the National Institute of Standards and Technology (NIST) have invented a new approach to testing multilayered, three-dimensional computer chips

New Insights on ‘Captured’ Electrons Could Improve Flash Memory

November 7, 2017

An entirely new model of the way electrons are briefly trapped and released in tiny electronic devices suggests that a long-accepted, industry-wide view is just

Atomic-Scale Movies Reveal That Catalyst Nanoparticles Undergo Internal Changes to Forge Carbon Nanotubes

September 20, 2017

Lights, camera, catalysis! Researchers at the National Institute of Standards and Technology (NIST) have made some of the first movies of the structural

Diagram of resistive ram on/off states with moving on/off switch.

With a Gentle Touch, NIST Scientists Push Us Closer to Flash Memory Successor

August 8, 2017

Sometimes a light touch is best: When you're telling a joke or hammering a tiny finishing nail into a wall, a gentle delivery often succeeds most effectively

Graphene Lid Revitalizes Imaging Technique

March 31, 2017

By capping liquids with graphene, an ultrathin sheet of pure carbon, researchers at the National Institute of Standards and Technology (NIST) and their

Images of yeast cells and silver dendrites.

New Microwave Imaging Approach Opens a Nanoscale View on Processes in Liquids

March 15, 2016

U.S. government nanotechnology researchers have demonstrated a new window to view what are now mostly clandestine operations occurring in soggy, inhospitable

SPS Interns Get the NIST Experience

September 17, 2015

It's not every day that undergraduate students contribute in a meaningful way to research at a national lab in the span of a few weeks. But that's what happened

New Chip Defect-finding Scheme Attracts Industry Leaders

May 27, 2015

Until recently, the semiconductor industry had a go-to method for quantifying atomic-scale defects in the billions of transistors contained in a single computer

New Imaging Technique Finds Formation of Aluminum Alloys to Blame for Next-Gen Battery Failures

March 3, 2015

Researchers working at the National Institute of Standards and Technology (NIST), the University of Maryland, and Sandia National Laboratories, have for the

Set up for X-ray Photoelectron Spectroscopy with Graphene Windows

Graphene Offers X-Ray Photoelectron Spectroscopy a Window of Opportunity

December 22, 2014

X-ray photoelectron spectroscopy (XPS) is one of the most sensitive and informative surface analysis techniques available. However, XPS requires a high vacuum

Researchers Take First Pictures of Baby Nanotubes

December 1, 2014

Single-walled carbon nanotubes are loaded with desirable properties. In particular, the ability to conduct electricity at high rates of speed makes them

Bright field transmission electron micrograph showing carbon nanotubes grown from an array of equally-sized iron catalyst particles created by electron beam-induced decomposition of a diiron nonacarbonyl precursor.

Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes

October 31, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used an environmental scanning transmission electron

In-Situ Observations Reveal How Nanoparticle Catalysts Lower Operating Temperatures in Fuel Cells

April 10, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used environmental transmission electron microscopy

Laying the Groundwork for 3D Stacked Integrated Circuits

February 17, 2012

Could three-dimensional stacked integrated circuits (3DS-ICs) be the next big innovation in technology development? Imagine layer upon layer of integrated

PML's Pernstich Develops Open-Source Software to Automate Test Equipment

February 6, 2012

A free, easily customizable software program for automating test equipment via GPIB or RS232 bus may sound too good to be true, especially for smaller companies

CNST Collaboration Models Ionic Conductivity in Doped Ceria for use as a Fuel Cell Electrolyte

January 11, 2012

Optimizing the conductivity of ceria based oxides, or doped ceria, is crucial to their use as electrolytes in future solid oxide fuel cells. Researchers from

PML Researchers Create Tool for 'Circuit-Aware' Reliability Testing

December 9, 2011

A PML research team has devised a reliability data transformation methodology that could ease one of the semiconductor industry's most vexing problems

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