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Day 1: December 5th, 2017

8:00 - 8:30 AM

Continental Breakfast

8:30 - 8:45 AM

Opening Remarks--- Joannie Chin, Deputy Director, NIST Engineering Laboratory

& Al Zielnik, Global Weathering Applications Manager, Atlas

Session 1: General (Chair: Al Zielnik, Atlas Material Testing Technology)

8:45 - 9:10 AM

Applying Weathering Science to Predict the Future – The Reliable Approach to Estimating Product Service Life, David Burns (3M)

9:10 - 9:35 AM

The DuraMAT Consortium: Integrating National Lab Expertise with Industry Needs to Improve PV Module Durability, Jonathan Trinastic (DOE)

9:35 - 10:00 AM

A novel Adhesive Mounted Building PV Technology, Christian Honeker (Fraunhofer USA)

10:00 - 10:15 AM


Session 2: PV Module Field Survey (Chair: George Kelly, Sunset)

10:15 - 10:40 AM

DuPont Worldwide Field Inspection Results, Tom Felder (Dupont, USA)

10:40 - 11:05 AM

PV Array Differential Backside Exposure Conditions: Backsheet Degradation and Site Design, Andrew Fairbrother (NIST)

11:05 - 11:30 AM

Trends in Field Failure Modes, John Wohlgemuth (PowerMark Corporation)

11:30 - 12:00 PM

Panel Discussion 1 (Chairs: Teresa Barnes, NREL & George Kelly, Sunset)

12:00 - 1:45 PM

Lunch and Poster Session

Session 3: Accelerated Laboratory Testing (Chair: David Miller, NREL)

1:45 - 2:10 PM

Sequential or Simultaneous Combination of Stress Factors, Michael Koehl (Fraunhofer ISE, Germany)

2:10 - 2:35 PM

Interdependent Multi-Stress Effect on PV Laminate and Backsheet Degradation, Xiaohong Gu (NIST)

2:35 - 3:00 PM

Thermal Cycling/Water Spray, ASTM D7869 - A Better Laboratory Approach to Climate Simulation, Allen Zielnik (Atlas Material Testing Technology)

3:00 - 3:15 PM


3:15 - 3:40 PM

Durability of Polymer Materials Subjected to Multi-Weathering Factors: The Role of Mechanical Stress, Guangxian Li (Sichuan Univ., China)

3:40 - 4:05 PM

Testing and analyses for multiple PID mechanisms and stresses, Peter Hacke (NREL)

4:05 - 4:30 PM

Panel Discussion 2 (Chairs: David Miller, NREL and Stephanie Watson, NIST)

4:30 PM

Adjourn/NIST Labs Tour (NIST SPHERE; Net-Zero Energy House)


Day 2: December 6th, 2017

8:00 - 8:30 AM

Continental Breakfast

Session 4: Linking Accelerated Testing to Field Performance and Lifetime Modeling (Chair: Nancy Phillips, DuPont)

8:30 - 8:55 AM

Field and Laboratory correlation of PV Materials, Bill Gambogi (Dupont, USA)

8:55 - 9:20 AM

Short-term and Long-term Failures Related to Encapsulant Observed in PV Power Plants, Tsuyoshi Shioda (Mitsui Chemicals, Japan)

9:20 - 9:45 AM

Assessment of Photovoltaic Module Backsheets as a Critical Indicator of Degradation and Modeling of Module Durability in Different Climatic Zones, Ken Boyce (UL)

9:45 - 10:00 AM


10:00- 10:25 AM

Statistical Modeling for SLP of PV Materials and Laminates, Yili Hong (Virginia Tech)

10:25 - 10:45 AM

Panel Discussion 3 (Chairs: Nancy Phillips, DuPont & John Wohlgermuth, PowerMark)

Session 5: Characterization (Chair: Xiaohong Gu, NIST)

10:45 - 11:10 AM

Prospects of 2D-luminescence spectroscopy for aging investigations of the embedding EVA polymer in PV modules, Beate Roeder (Humboldt-Universität, Germany)

11:10 - 11:35 AM

Quantifying adhesion in PV modules: A historical survey and degradation processes, Nick Bosco (NREL)

11:35 - 12:00 PM

Optical Characterization of PV Glass Coupons and PV Modules Related to Soiling Losses, Greg Smestad (Sol Ideas Technology Development)

12:30 - 1:30 PM


1:30 - 1:55 PM

Survey of Mechanical Durability of PV Backsheets in Response to Accelerated Stress Testing, Mike Kempe (NREL)

1:55 - 2:20 PM

Fragmentation Test for Crack Propensity Evaluation of PV Backsheets, Jae Hyun Kim (NIST)

2:20 - 2:45 PM

Panel Discussion 4 (Michael Koehl, Fraunhofer ISE & Xiaohong Gu, NIST)

2:45 - 3:00 PM


Session 6: Link Research to Standards (Chair: David Burns, 3M)

3:00 - 3:25 PM

DC Voltage Breakdown of Relied Upon Insulator Materials: Test Method development and Results from Artificially Weathered and Veteran Specimens, David Miller (NREL)

3:25 - 3:50 PM

Progress in IEC PV Component Weathering Standards, Nancy Phillips (DuPont)

3:50 - 4:15 PM

IEC Standards Development and the IECRE Conformity Assessment System, George Kelly (Sunset Technology)

4:15 - 4:40 PM

Panel Discussion 5 (Chairs: David Burns, 3M & Allen Zielnik, Atlas)

4:40 PM

Summary and Adjourn (Al Zielnik, Atlas & Xiaohong Gu, NIST)

Created July 12, 2017, Updated January 9, 2018