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Presentations
Day 1: December 5th, 2017
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8:00 - 8:30 AM |
Continental Breakfast |
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8:30 - 8:45 AM |
Opening Remarks--- Joannie Chin, Deputy Director, NIST Engineering Laboratory & Al Zielnik, Global Weathering Applications Manager, Atlas |
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Session 1: General (Chair: Al Zielnik, Atlas Material Testing Technology) |
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8:45 - 9:10 AM |
Applying Weathering Science to Predict the Future – The Reliable Approach to Estimating Product Service Life, David Burns (3M) |
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9:10 - 9:35 AM |
The DuraMAT Consortium: Integrating National Lab Expertise with Industry Needs to Improve PV Module Durability, Jonathan Trinastic (DOE) |
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9:35 - 10:00 AM |
A novel Adhesive Mounted Building PV Technology, Christian Honeker (Fraunhofer USA) |
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10:00 - 10:15 AM |
Break |
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Session 2: PV Module Field Survey (Chair: George Kelly, Sunset) |
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10:15 - 10:40 AM |
DuPont Worldwide Field Inspection Results, Tom Felder (Dupont, USA) |
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10:40 - 11:05 AM |
PV Array Differential Backside Exposure Conditions: Backsheet Degradation and Site Design, Andrew Fairbrother (NIST) |
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11:05 - 11:30 AM |
Trends in Field Failure Modes, John Wohlgemuth (PowerMark Corporation) |
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11:30 - 12:00 PM |
Panel Discussion 1 (Chairs: Teresa Barnes, NREL & George Kelly, Sunset) |
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12:00 - 1:45 PM |
Lunch and Poster Session |
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Session 3: Accelerated Laboratory Testing (Chair: David Miller, NREL) |
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1:45 - 2:10 PM |
Sequential or Simultaneous Combination of Stress Factors, Michael Koehl (Fraunhofer ISE, Germany) |
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2:10 - 2:35 PM |
Interdependent Multi-Stress Effect on PV Laminate and Backsheet Degradation, Xiaohong Gu (NIST) |
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2:35 - 3:00 PM |
Thermal Cycling/Water Spray, ASTM D7869 - A Better Laboratory Approach to Climate Simulation, Allen Zielnik (Atlas Material Testing Technology) |
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3:00 - 3:15 PM |
Break |
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3:15 - 3:40 PM |
Durability of Polymer Materials Subjected to Multi-Weathering Factors: The Role of Mechanical Stress, Guangxian Li (Sichuan Univ., China) |
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3:40 - 4:05 PM |
Testing and analyses for multiple PID mechanisms and stresses, Peter Hacke (NREL) |
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4:05 - 4:30 PM |
Panel Discussion 2 (Chairs: David Miller, NREL and Stephanie Watson, NIST) |
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4:30 PM |
Adjourn/NIST Labs Tour (NIST SPHERE; Net-Zero Energy House) |
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Day 2: December 6th, 2017 |
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8:00 - 8:30 AM |
Continental Breakfast |
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Session 4: Linking Accelerated Testing to Field Performance and Lifetime Modeling (Chair: Nancy Phillips, DuPont) |
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8:30 - 8:55 AM |
Field and Laboratory correlation of PV Materials, Bill Gambogi (Dupont, USA) |
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8:55 - 9:20 AM |
Short-term and Long-term Failures Related to Encapsulant Observed in PV Power Plants, Tsuyoshi Shioda (Mitsui Chemicals, Japan) |
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9:20 - 9:45 AM |
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9:45 - 10:00 AM |
Break |
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10:00- 10:25 AM |
Statistical Modeling for SLP of PV Materials and Laminates, Yili Hong (Virginia Tech) |
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10:25 - 10:45 AM |
Panel Discussion 3 (Chairs: Nancy Phillips, DuPont & John Wohlgermuth, PowerMark) |
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Session 5: Characterization (Chair: Xiaohong Gu, NIST) |
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10:45 - 11:10 AM |
Prospects of 2D-luminescence spectroscopy for aging investigations of the embedding EVA polymer in PV modules, Beate Roeder (Humboldt-Universität, Germany) |
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11:10 - 11:35 AM |
Quantifying adhesion in PV modules: A historical survey and degradation processes, Nick Bosco (NREL) |
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11:35 - 12:00 PM |
Optical Characterization of PV Glass Coupons and PV Modules Related to Soiling Losses, Greg Smestad (Sol Ideas Technology Development) |
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12:30 - 1:30 PM |
Lunch |
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1:30 - 1:55 PM |
Survey of Mechanical Durability of PV Backsheets in Response to Accelerated Stress Testing, Mike Kempe (NREL) |
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1:55 - 2:20 PM |
Fragmentation Test for Crack Propensity Evaluation of PV Backsheets, Jae Hyun Kim (NIST) |
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2:20 - 2:45 PM |
Panel Discussion 4 (Michael Koehl, Fraunhofer ISE & Xiaohong Gu, NIST) |
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2:45 - 3:00 PM |
Break |
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Session 6: Link Research to Standards (Chair: David Burns, 3M) |
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3:00 - 3:25 PM |
DC Voltage Breakdown of Relied Upon Insulator Materials: Test Method development and Results from Artificially Weathered and Veteran Specimens, David Miller (NREL) |
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3:25 - 3:50 PM |
Progress in IEC PV Component Weathering Standards, Nancy Phillips (DuPont) |
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3:50 - 4:15 PM |
IEC Standards Development and the IECRE Conformity Assessment System, George Kelly (Sunset Technology) |
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4:15 - 4:40 PM |
Panel Discussion 5 (Chairs: David Burns, 3M & Allen Zielnik, Atlas) |
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4:40 PM |
Summary and Adjourn (Al Zielnik, Atlas & Xiaohong Gu, NIST) |