Nanoelectronics

News and Updates

Atomic ‘Swiss Army Knife’ Precisely Measures Materials for Quantum Computers

July 6, 2020

It images single atoms. It maps atomic-scale hills and valleys on metal and insulating surfaces. And it records the flow of current across atom-thin materials

NIST Scientists Create New Recipe for Single-Atom Transistors

May 11, 2020

Once unimaginable, transistors consisting only of several-atom clusters or even single atoms promise to become the building blocks of a new generation of

Getting a closer look at living cells and batteries: a little bit of graphene goes a long way

March 6, 2020

Researchers at NIST have devised a way to eliminate a long-standing problem affecting our understanding of both living cells and batteries. When a solid and an

What a Switch! NIST-Led Team Develops Tiny Low-Energy Device to Rapidly Reroute Light in Computer Chips

November 14, 2019

Researchers at the National Institute of Standards and Technology (NIST) and their colleagues have developed an optical switch that routes light from one

Projects and Programs

Fig. 1. Die containing 285 superparamagnetic tunnel junctions.

Spintronics for Neuromorphic Computing

One of the most promising new approaches to next generation information processing is spintronics, where information is carried with electronic spin rather than

Chemical Functionalization and Manipulation of Nano Materials

This project focuses on understanding the potential for nanoscale engineered materials to advance state-of-the-art spectroscopic techniques and foster the

Neuromorphic Device Measurements

Neuromorphic computing is a radical new approach to information processing for artificial intelligence where, instead of using digital electronics, inspiration

Small array of transistors designed for single device integration.

Integrated CMOS Testbeds for Nanoelectronics and Machine Learning

With the rapid rise of artificial intelligence and its insatiable demand for low-energy, high performance computing, research is accelerating into novel

Publications

Charge conductivity in donoracceptor polymer dispersions measured with time-resolved terahertz spectroscopy

October 5, 2020

Author(s)

Timothy J. Magnanelli, Edwin J. Heilweil

Ultrafast Time-Domain and Time-Resolved Terahertz (TDS/TRTS) spectroscopic methods are utilized to explore photoconductive properties of conjugated donor

Microwaves and Microscopy (Guest Editorial)

September 16, 2020

Author(s)

Thomas M. Wallis, Marco Farina

Welcome to this special issue of IEEE Microwave Magazine, which is focused on the topic of Microwaves and Microscopy. As that title implies, this topic lies

Detecting nanoscale contamination in semiconductor fabrication using through-focus scanning optical microscopy

August 28, 2020

Author(s)

Min-Ho Rim, Emil Agocs, Ronald G. Dixson, Premsagar P. Kavuri, Andras Vladar, Ravikiran Attota

The effect of strain on tunnel barrier height in silicon quantum devices

July 13, 2020

Author(s)

Ryan M. Stein, Michael D. Stewart

Semiconductor quantum dot (QD) devices experience a modulation of the band structure at the edge of lithographically defined gates due to mechanical strain

Software

MOSAIC

MOSAIC is a modular single-molecule analysis toolbox to decode multi-state single-molecule and nanopore time-series data. Read the documentation for additional

Tools and Instruments

Precision Imaging Facility

The Precision Imaging Facility (PIF) is a cooperative research facility at the National Institute of Standards and Technology (NIST) dedicated to the