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Projects/Programs

Topic Area
Displaying 426 - 450 of 1644

Documentary Standards: Radiation Detection Documentary Standards Program

Ongoing
NIST leads and participates in the development and revision of documentary ANSI/IEEE (ANSI N42 standards currently transitioning to IEEE IMS TC 45 committee) and IEC (TC 45 WG B15 committee) standards that provide requirements and test methods for instruments used for the detection of illicit

Documentary Standards: X-ray Security Screening Applications

Ongoing
This work fills well-documented gaps in transportation security, which have been highlighted in Executive and Legislative requirements for 100 % screening of baggage, cargo, and airline passengers. This is accomplished through a corpus of new standards, test methods, test artifacts, dosimetry

Drug Analysis - Opioids and Emerging Threats

Ongoing
Package Interdiction Many synthetic opioids and novel psychoactive substances enter the country through international mail. Research in this area focuses on measurement challenges associated with detection and analysis of these packages at the point of seizure in international mail facilities

DUV/EUV Nanoscopy for Imaging Nanostructures

Ongoing
Novel optical nanoscopy techniques using deep-ultraviolet (DUV) and extreme-ultraviolet (EUV) laser sources are developed to characterize nanostructures with high dimensional sensitivity and low uncertainty for advancing the semiconductor devices manufacturing process. The illumination beam is

Dynamic EUV Imaging and Spectroscopy for Microelectronics

Ongoing
Collaborations with industry leaders have led us to develop new measurement techniques to improve our understanding thermal transport, spin transport, and nanoscopic (and interfacial) material properties in active device structures. Such capability requires the ability to measure these properties at

Dynamic EUV Metrology of Nanoscopic Thermal Transport in Active Devices

Ongoing
Heat is greatly impeding progress in microelectronics, which is only getting worse as dimensions are reduced and device architectures move more towards being 3-dimensional. The dynamics and physics of nanoscale thermal transport are unknown and dynamic measurements of active devices at this scale do

Dynamic Mechanical Metrology: Acceleration, Force, and Acoustics

Ongoing
The Dynamic Mechanical Metrology Project develops standards and provides calibrations for SI-traceable acceleration, acoustical and dynamic force metrology. We develop improved reference standards and calibration techniques, sensor-embedded standards, calibration techniques for new technologies, and

Dynamic Nanoflow Metrology

Ongoing
Ultra-precise and dynamic flow measurements are needed for high-throughput biological studies and for dynamic control of chemical delivery systems in medical and biotechnology applications. In addition, existing analytical methods, such as analytical high-performance liquid chromatography (HPLC) and

Dynamic Plasticity: Non-Equilibrium Mechanics

Ongoing
The optimization of high-speed machining processes through powerful finite element modeling techniques is an important pathway to American manufacturing competitiveness in an increasingly competitive global marketplace. Quantitatively accurate simulations of machining rely on robust constitutive

Dynamic Pressure

Ongoing
Measurement Platform: We are developing a photonics based dynamic pressure measurement platform that will enable traceable, accurate measurement of dynamic pressure. To this end we are developing fast scanning laser absorption spectroscopy techniques that enable rapid measurement of pressure

Earthquake Risk Reduction in Buildings and Infrastructure Program

Ongoing
Objective: The Program’s objective is to develop and advance knowledge which can improve codes, standards, and design guidelines for earthquake risk mitigation of buildings and infrastructure systems with the focus on recovery-based design. These efforts supplement NIST’s role as lead agency for the

E-Authentication

Ongoing
Information regarding recent work can be found at our IDENTITY & ACCESS MANAGEMENT page.

Ecogenotoxicity Measurements of Nanoparticles

Completed
Intended Impact Understanding the potential environmental fate of NPs has direct implications to the US economy, as potential environmental and human health impacts of NPs is one of the main factors slowing the commercialization of this technology. Reducing the uncertainty regarding the

Edge AI

Ongoing
This project: Develops edge learning and edge-enabled collaborative learning algorithms. Develops measurement methods for testing the performance and robustness of edge-learned, and more generally collaboratively learned, AI/ML models. Collaborates with other projects (e.g., 5G/6G Core Network

Efficient Optical Spectroscopy of Single Solid-State Quantum Emitters

Ongoing
For emitters embedded in semiconductors, such as a quantum dot in GaAs, the fluorescence collection efficiency is limited by the large refractive index contrast between the semiconductor in comparison to the surrounding air. This causes most of the light emission to remain trapped in the

Electric Power Metrology and the Smart Grid

Ongoing
Major advancements in electric power generation, transmission, distribution and loads over the last 20 years have led to improvements, reliability, robustness, efficiency and energy security unlike anything from the proceeding 80 years. Combined, this power grid modernization has been called the

Electrical Characterization of Nanoscale Electron Devices

Ongoing
Over the decades, many measurement methods were developed to meet the needs of advancing electron device/circuit/system technology. As technology continue to advance, new needs continue to surface, either due to old measurements are no longer adequate or due to no established method exists. A case

Electrical Scanning Probe Microscopy

Ongoing
Electrical scanning probe microscopes (eSPMs) are a subset of scanning probe microscopes which measure some electrical parameter as well as surface topography. These include techniques such as scanning capacitance microscopy (SCM), scanning spreading resistance microscopy (SSRM), conductive atomic

Electroacoustic Wave-Based Flow Sensors

Ongoing
As part of our NIST-on-a-Chip efforts, we are developing strategies to measure local flow in microfluidic systems. This project will develop label-free flow sensors using surface acoustic waves embedded in microfluidic devices. In this approach, an electromechanical transducer is placed on a

Electrochemistry

Ongoing
Operando Measurements Measurements of the structure and dynamics of metal-electrolyte interfaces are essential for understanding mechanisms of electrocatalysis and electrodeposition that are key to optimization of materials processing and utilization in wet chemical environments. Our measurement
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