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Projects/Programs

Topic Area
Displaying 1101 - 1125 of 1644
Open CALPHAD Logo

OpenCALPHAD

Ongoing
Thermodynamic data are essential for the understanding, developing, and processing of materials. The CALPHAD technique has made it possible to calculate properties of multicomponent systems using databases of thermodynamic descriptions with models that were assessed from experimental data. The OC
EDMR set up to measure the electrode process of an electrochemical cell.

Operando Measurements of Electrochemical (Charge-transfer) Processes

Ongoing
There are two ways to study a very fast process such as charge transfer. One can use very high-speed measurement that can follow the effect of the process, or one use a method that is sensitive only to the process itself. Either way has its weakness. Many fast measurements can follow the process

Operational Technology Security

Ongoing
Operational technology (OT) encompasses a broad range of programmable systems or devices that interact with the physical environment (or manage devices that interact with the physical environment). These systems/devices detect or cause a direct change through the monitoring and/or control of devices

Operations-driven Performance Measurement for Smart Manufacturing Systems

Ongoing
Objective: Develop and deploy standards, guidelines, and reference data for measuring the performance of manufacturing systems to inform the design and aid in analysis of factory improvements. Technical Idea: Manufacturers are adopting smart systems to drive gains in agility, productivity, quality
fentanyl

Opioid Detection and Identification

Ongoing
Safe Handling Fentanyl can be 100 times stronger than heroin. Even deadly street drugs contain very small amounts of fentanyl, so it can be difficult to detect with methods used for other common drugs. NIST researchers developed a method sensitive enough to detect fentanyl on the outside of drug
BO+WKB model

Optical Clock Atomic Structure and Theory

Ongoing
An atomic clock aims to realize the intrinsic ticking rate of an atom. This ticking rate (i.e., frequency) is associated with a transition between two quantum levels of the atom, where each level corresponds to a different configuration of the electrons around the nucleus. Atomic clocks derive their
schematic

Optical/electrical particle measurement system

Ongoing
Intended Impact The results of this work should provide instrument manufacturers with data, methods, and algorithms for enhancing the clarity and accuracy of information their instruments provide to their customers. Users of these instruments (pharma companies) and regulators, will have better

Optical grating scatterometry

Ongoing
In the past few years, scatterometry has emerged as a method for performing linewidth and line profile metrology, especially by the semiconductor industry. The method uses a periodic target containing repetitive lines whose profile, i.e., its width, height, and shape, is to be determined. The
yb optical clock

Yb Optical Lattice Clock

Ongoing
In recent years, optical clocks have achieved performance that is orders of magnitude beyond more traditional atomic clocks utilizing a microwave timebase. A particularly promising type of advanced optical clock is the optical lattice clock. At their heart, these systems use an ensemble of ultracold

Optical medical imaging

Ongoing
Optical medical imaging technologies proliferate in academic research and yet very few translate into the clinic. Optical techniques have high spatial and spectral resolution, lends itself to portability, and inexpensive relative to conventional imaging modalities such as MRI (Magnetic Resonance
NIST 193 nm Microscope.

Optical Methods for 3-D Nanostructure Metrology (Archived)

Completed
This project develops new approaches to optical microscopy based on a high magnification optical platform that samples the full 3-D scattered field. Both the semiconductor industry and the evolving nanomanufacturing sector are facing enormous challenges measuring nanometer scale features over large
micro-focus Brillouin Light scattering spectrometer

Optical and Microwave Spectroscopy of Microelectronic Systems

Ongoing
Collaborations with industry leaders have led to new understanding of magnetic damping in advanced materials and replication of our magnetic metrology tools. We investigate fundamental aspects of spin transfer in materials and structures that offer improved performance in future devices such as
lownoisemicrowave

Optical and Microwave Waveform Synthesis

Ongoing
A typical optical frequency comb consists of thousands to millions of phase coherent modes (the "teeth" of the comb) that can all be used to synthesize precisely controlled electromagnetic waveforms. Our main research thrust in this area has been focused on the generation of microwave and millimeter
Spectroscopic ellipsometry measurement of a 2D monolayer and the optical property for such a thin layer.

Optical and Optoelectronic Materials Characterization

Ongoing
Today's electronics have reached a point where sheer computation power has combined form and function as the key driver of large consumer markets. The demand for portable and pervasive electronics with greater functionality promises significant changes over the next decades in how society interacts
spatial frequency domain Mueller matrix imager

Optical Polarization Metrology

Ongoing
Electromagnetic waves are transverse. That is, besides propagating energy, they also have polarization represented by the direction of the electric field, which is constrained to lie in the plane perpendicular to the direction of propagation. Light rays can be characterized by a four-element Stokes
A magnon, or spin wave, in a 1D chain. Credit: Sean Kelley/NIST

Optical Probes of 2D Magnetic Phenomena

Ongoing
The unique measurement capabilities developed in this Project enable diffraction-limited, optical spectra (both Raman and photoluminescence) to be collected and analyzed as a function of laser energy, polarization, temperature, magnetic field, and device parameters such as current load and back
Detector-Based Radiometric Scale for both power and irradiance modes, including traceability from Cryogenic Standard

Optical Radiation Metrology and Standard Radiometers

Ongoing
Radiometric, radiance temperature, photometric, and color scales have been realized based on the spectral responsivity of standard detectors and radiometers. These reference responsivity scales have been transferred to other NIST calibration facilities to realize and maintain these detector-based

Optical scattering from surfaces

Ongoing
Light Scattering Ellipsometry: The polarization of scattered light can often indicate the source of that scattered light. Using Light Scattering Ellipsometry, whereby the polarization of light scattered into directions out of the plane of incidence is measured for a fixed incident polarization
OTWTFT

Optical Two-way Time-frequency Transfer

Ongoing
Researchers in the Fiber Sources and Applications Group have been developing the technique of “Optical Two-Way Time-Frequency Transfer” (OTWTFT) which can link time between distant clocks to the femtosecond level over free-space links. Optical clock networks could enable tests of fundamental physics
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