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Nanotechnology

Projects/Programs

Displaying 101 - 113 of 113
modulation

Quantum Waveform Metrology

Ongoing
The 2019 redefinition of the SI was motivated in part by the success of quantum electrical standards, such as those based on the Josephson and quantum Hall effects. Quantum standards enable the direct realization of physical quantities that are traceable to fundamental constants, invariant with

Raman Metrology and Instrumentation

Ongoing
Raman spectroscopy/microscopy is a powerful optical technique for rapid, non-destructive, label-free characterization of materials. It works under ambient conditions, often without requirement of any sample preparation. Applications span microelectronics, pharmaceutical, security and fundamental
JMONSEL simulation

Scanning-electron microscopy

Ongoing
Nanoscale measurements provide necessary feedback for the fabrication of nanoscale structures. However, achieving subnanometer uncertainty is challenging for even the best microscope systems. The challenge is even greater for three-dimensional nanostructures, which often require measurement of
Measurements of transition probability vs. pulse length and detuning

Sequential Bayesian Experiment Design

Completed
We develop and publish the optbayesexpt python package. The package implements sequential Bayesian experiment design to control laboratory experiments for efficient measurements. The package is designed for measurements with: an experiment (possibly computational) that yields measurements and
nanopore event

Single-molecule biosensors

Ongoing
We are developing new tools to investigate the energy landscape of single-molecule sensors. Our goal is to apply a wide-ranging array of technologies to probe the critical physicochemical properties of nanopore biosensors. These properties include the free energy of confinement for polymers as they
Schematic of device structure designed to utilize novel spin current generation in a ferromagnet (FM) to achieve electrical switching of a perpendicularly magnetized FM layer

Spin-orbit interaction in devices and quantum materials

Ongoing
The spin degree of freedom can provide a basis for next-generation electronic devices. Spintronic devices typically include materials with magnetic ordering, such as ferromagnets or antiferromagnets. The state of the magnetization influences charge and spin current through an effect known as
Prototype standard for super-resolution optical microscopy

Super-resolution optical microscopy

Ongoing
Optical microscopy has been fundamental to science for four centuries, enabling resolution of the microscale. In the last two decades, scientists have made the remarkable discovery that super-resolution methods can extend optical microscopy deep into the nanoscale. It is now possible to detect and
Mechanical stylus instrument

Surface Texture and Forensic Topography

Ongoing
Surface texture and microform Surface texture affects the functionality of many products, ranging from bearings to semiconductors and optics. Affected properties include aesthetics, friction, wear, lubrication, sealing, light scattering, and conductivity. Improvements in parameters and metrology to

Templated Assembly of Block Copolymer Films

Completed
Viable nanomanufacturing of templated block copolymers will require a capability to control orientation and line edge roughness of trillions of structures to within a single nanometer, however there are no existing platforms that meet this need. We are developing small angle x-ray and neutron
The excellent agreement of measured and simulated TSOM images allow for more reliable quantitative results

Three-Dimensional Nanometer Metrology

Ongoing
Important physical and chemical properties of nanometer scale devices and structures depend on their shape and size. The benefits of nano are already increasing many applications, and are expected to grow significantly. For these applications, measurement accuracy is a fundamental measurement
Microscopy standard linking critical dimensions of line-space arrays and frustum arrays of varying pitch, for hybrid metrology by optical microscopy, scanning electron microscopy,atomic force microscopy, and the NIST line-scale interferometer

Universal Microscopy Standards

Ongoing
Microscopy standards that are available today have inadequate performance characteristics. As device linewidths decrease toward physical limits, the international roadmap of devices and systems (IRDS) has set uncertainty targets by the year 2025. This target is hard to hit, challenging the industry
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