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The Surface and Trace Chemical Analysis Group (STCAG) conducts both applied and fundamental research into the development, characterization, and analysis of
Ambient and atmospheric pressure mass spectrometry platforms provide sample collection, transport, and ionization for vapor, aerosol, and liquid samples
Because of NIST's role as the National Metrology Institute (NMI) in the U.S., the Chemical Sciences Division's measurement capabilities must be benchmarked
Magnetic sector secondary ion mass spectrometry (SIMS) generates isotopic and elemental information from solid surfaces with depth profiling capabilities to
The "first-of-its-kind" in an entirely new class of reference material, NIST PS1 Primary Standard for quantitative NMR (Benzoic Acid) is now available! The PS
The use of cluster sources such as C60 and argon gas cluster ion beams (Ar GCIB) allow for the analysis of the subsurface volume. It can also minimize the
Metagenomics, or identifying the organisms present in a sample through DNA-based analysis, is a revolutionary technology made possible through advances in
Surface desorption ambient mass spectrometry enables direct solid surface interrogation for sampling and ionization of trace analytes. This project encompasses
Thermal desorption ambient mass spectrometry decouples analyte desorption and ionization. Here, analytes are thermally desorbed directly from a primary surface
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) employs a pulsed primary ion beam and a time-of-flight mass analyzer for the detection of molecular