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Metrology

Projects/Programs

Keyword

Organizational Unit

Autonomous Systems for Materials Research and Metrology: Accelerating Discovery and Democratizing Science

Ongoing

Materials scientists often need to search high dimensional spaces for knowledge. For example, a scientist may be interested in learning how a material property (e.g. hardness) changes over many (for example, 10) values of a synthesis or processing parameter (e.g., annealing temperature). Such an

Calibration Services: National Air-Kerma Standard for Electronic Brachytherapy

Ongoing

The increased use of limited-lifetime electronic brachytherapy sources which are miniature, low-energy x-ray tubes for clinical applications resulted in the need of a measurement of air-kerma dose from NIST. The type of electronic brachytherapy sources, Axxent S700, used at NIST operates at tube

Calibration Services: New Calibration Facility for X-Ray Air Kerma

Ongoing

The NIST x-ray calibration facility is composed of a suite of rooms that includes the 11 m by 7 m calibration range, a dedicated equipment room, connected by custom shielding ports for communication with the x-ray tubes in the radiation area, an operator control center with a viewing window and

Electron and Photon Absrobed-Dose-to-Water

Calibrations: Water Calorimetry Primary Standards for Absorbed Dose to Water

Ongoing

While NIST maintains the original standard for use in Co-60, preliminary work has been done to commission a standard for use in high-energy x-ray beams from the NIST medical linear accelerator (Varian Clinac 2100C). Completion of this task will enable NIST to provide direct calibrations in 6 MV and

CalNet

Ongoing

Electronics engineers use on-wafer calibration die to calibrate measurement equipment before characterizing or modeling semiconductor devices. While NIST pioneered on-wafer calibrations in the 1990’s, most industrial labs use commercial ‘Impedance Standard Substrates’ (ISS) that are manufactured by

Image showing a variety of gas tanks with carbon dioxide

Carbon Dioxide Measurements and Reference Materials

Ongoing

CO 2 Reference Materials The Gas Sensing Metrology Group at NIST has a long history of providing reference materials to industry, monitoring communities, and academia. The program began in the 1970’s by developing an initial suite of CO2 primary standard mixtures (PSMs) to support the US Department

a conceptual diagram of a gate-all-around (GAA) field-effect transistor

Causal Green's function simulations of phonons for multiscale/multiphysics modeling of thermal transport in gate-allaround transistors

Ongoing

Heat management in modern semiconductor devices at nanoscal es is a multiscale and multiphysics problem of strong industrial interest. The power density in modern nanoscale devices becomes extremely high, whichcan drastically reduce the efficiency and the lifespan of the device. This problem

Wordcloud consisting of words CCQM metrology group task etc.

CCQM Activities in the Gas Analysis Working Group

Ongoing

The results from these Key comparisons will be used to benchmark the appropriate Calibration and Measurement Claims (CMCs) of the participating NMIs. CMCs are basically the declared capabilities that an NMI offers to customers, and they are included in a searchable database at the BIPM web site

Certification of Three Soil SRMs for Inorganic Environmental Measurements

Completed

The three NIST soil SRMs, 2709, 2710 and 2711, have been used worldwide by hundreds of laboratories; combined sales typically exceed 800 units per year. Use of these SRMs provides our customers with tools that are essential for achieving quality assurance in the analysis of contaminant elements in

RF Channel Propagation Measurements and Models for Communications Circuits

Ongoing

The research community has long identified the need for propagation measurements to develop and evaluate communication circuits. Since 2011, NIST has been to prototyping state-of-the-art channel sounders for measuring RF channel propagation. NIST current channel sounders include LIDAR and camera

Characterization of Nano-to-Microscale Process-Induced Thermo-Mechanical Changes in Heterogeneously Integrated Microelectronics

Ongoing

Across the entire semiconductor industry, issues related to thermomechanical mismatches encountered during packaging are limiting factors in the design and fabrication of 3D modular integrated circuits. This project will develop novel and necessary metrologies for thermomechanical properties of

Charpy Machine Verification Program

Ongoing

The Charpy test is a high loading rate test that measures the energy absorbed during fracture, hence providing an indirect measure of impact toughness. For a Charpy machine to maintain an accurate absorbed energy scale, periodic verification with certified specimens is required. To achieve the

Photograph of titanium metal crystal with cubic symmetry.

Chemical Metrology for Metals, Ores, and Related Materials

Ongoing

In the arena of industrial commodities, the primary challenges are to provide measurement tools and reference materials that allow U.S. industry to establish comparability of measurement results to results obtained by customers, competitors, and regulators for the basic chemical properties of

Chemical Metrology for Polymers Manufacturing

Ongoing

This project is designed to strengthen the analytical capabilities of polymers manufacturers by introducing reference materials, critically evaluating standard test methods, and educating those industry representatives who participate in standards development organizations. Certified reference

Illustration of satellite sensing of sunlight reflected by buildings, roads, water and trees to assess radiative warming of the earth.

Climate Science

Ongoing

This program encompasses multifaceted efforts to advance the metrology of climate science. Projects include: development of ultra-high accuracy optical standards and technologies to determine greenhouse gases (GHGs) concentrations, atmospheric lifetimes, and aerosol radiative forcing development of

Clinical and Forensic Reference Materials

Ongoing

Below is a listing of the reference materials currently produced by the Applied Genetics group. Clinical Diagnostics SRM 2393 - CAG Repeat Length Mutation in Huntington`s Disease SRM 2365 - BK Virus DNA Quantitative Standard SRM 2366a - Cytomegalovirus DNA (Towne Δ147 BAC) for DNA SRM 2367 - JC

Clinical Measurements Quality Assurance Program

Ongoing

The National Institute of Standards and Technology (NIST) established the Clinical Measurements Quality Assurance Program (ClinQAP) to support the measurement needs of the clinical community. Participants measure concentrations of marker compounds, contaminants, metabolites in clinical samples (e.g

CODATA values of the fundamental physical constants

Ongoing

CODATA recommended values of the constants Database of references for data on the constants Publications: Reviews of Modern Physics ( 1998) ( 2002) ( 2006) ( 2010) ( 2014) Journal of Physical and Chemical Reference Data ( 1998) ( 2006) ( 2010) Resource Letter FC-1: The physics of fundamental

Combinatorial Approaches to Thin Film Nanomaterials

Completed

The behavior and performance of nanostructured materials and devices are governed by the chemistry and structure of their surfaces and interfaces. However, chemistry-structure-performance relationships in these systems are complex, so hundreds of experiments can be necessary to determine optimal

Compatibility Assessment and Bias Estimation for Standard Reference Materials

Ongoing

DESCRIPTION: See the special publication listed in the major accomplishments section.

Continuing Support of Cement Manufacturing

Ongoing

NIST SRMs for Portland cement and related materials are the de facto world standards for validation of analytical methods for testing of cement for compliance with manufacturing specifications and for qualification of laboratories throughout the supply chain, including cement plants, construction

Diagram of the CDSAXS method, shows an x-ray beam going through a sample and onto an e-ray detector.

Critical Dimension Small Angle X-Ray Scattering (CDSAXS) for Next Generation in-line Metrology

Ongoing

The semiconductor industry is in need of new in-line dimensional metrology methods to measure the size and shape of nanoscale structures such as gate-all-around transistors, 3D-NAND, and 3D-DRAM for process control. The NIST-developed CDSAXS method has recently been commercialized for

Data Science

Ongoing

Current MIG Data Science project activities DARPA D3M. NIST is supporting the DARPA D3M (Data-Driven Discoveries of Models) program as part of the Test and Evaluation (Government) Team. The D3M Program aims to allow automated systems with subject matter experts to model and solve complex machine

Deployable Doppler Thermometry

Ongoing

Accurate temperature measurements are essential to many industrial processes, including petrochemical or pharmaceutical production and nuclear power generation. Typical process control thermometers, such as resistance temperature detectors, are known to drift over time and degrade when subject to

Detecting Change Points in Surface Temperature Records

Ongoing

DESCRIPTION: For the purpose of exposition, consider the record daily minimums averaged by month for a station near Reno Nevada. There is a clear drop in the level between 1920 and 1940 and a positive drift starting at about 1980. There is also however, considerable variability due to seasonal

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