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Dimensional metrology

News and Updates

Helping Laser Scanners Measure Up

Scientists at the National Institute of Standards and Technology (NIST) have devised a novel, accurate, easy-to-operate, time- and labor-saving way to provide

Projects and Programs

SI Length and Traceability

Ongoing
To enable our highest accuracy calibrations and NIST advanced research efforts, we maintain and develop methods to provide traceability to the meter via laser

Diffraction Metrology and Standards

Ongoing
Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for characterization of

Publications

DIC Challenge 2.0: Developing Images and Guidelines for Evaluating Accuracy and Resolution of 2D Analyses: Focus on the Metrological Efficiency Indicator

Author(s)
Philip Reu, EMC Jones, S.S. Fayad, B. Blaysat, E. Toussaint, Mark Iadicola, P. Lava, J Rethore, J. Yang, K. Bhattacharya, L. Yang, D. Deb, C.S.R. Vemulapati, M Klein, E Ando, E Roubin, O. Stamati, C Couture, Alexander Landauer, M. Liu, S Jaminion, T. Siebert, S.N. Olufsen
Background The DIC Challenge 2.0 follows on from the work accomplished in the first Digital Image Correlation (DIC) Challenge Reu et al. (Experimental Mechanics

Tools and Instruments

Precision Imaging Facility

The Precision Imaging Facility (PIF) is a cooperative research facility at the National Institute of Standards and Technology (NIST) dedicated to the