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Dimensional metrology

News and Updates

Helping Laser Scanners Measure Up

Scientists at the National Institute of Standards and Technology (NIST) have devised a novel, accurate, easy-to-operate, time- and labor-saving way to provide

Projects and Programs

Dimensional Measurement Services

Ongoing
The Dimensional Measurement Services (DMS) project delivers unique high-accuracy length based calibrations that are essential to global trade, supports basic

Material Qualification

Ongoing
The lack of repeatable process outcomes from additive manufacturing (AM) has been broadly acknowledged as an impediment to widespread implementation. While most

Precursor Material Qualification

The lack of repeatable process outcomes from additive manufacturing (AM) has been broadly acknowledged as an impediment to widespread implementation. While most

Publications

DIC Challenge 2.0: Developing Images and Guidelines for Evaluating Accuracy and Resolution of 2D Analyses: Focus on the Metrological Efficiency Indicator

Author(s)
Philip Reu, EMC Jones, S.S. Fayad, B. Blaysat, E. Toussaint, Mark Iadicola, P. Lava, J Rethore, J. Yang, K. Bhattacharya, L. Yang, D. Deb, C.S.R. Vemulapati, M Klein, E Ando, E Roubin, O. Stamati, C Couture, Alexander Landauer, M. Liu, S Jaminion, T. Siebert, S.N. Olufsen
Background The DIC Challenge 2.0 follows on from the work accomplished in the first Digital Image Correlation (DIC) Challenge Reu et al. (Experimental Mechanics

Sub-picoliter traceability of microdroplet gravimetry and microscopy

Author(s)
Lindsay Elliott, Adam L. Pintar, Craig Copeland, Thomas Brian Renegar, Ronald G. Dixson, Robert Ilic, R. Michael Verkouteren, Samuel Stavis
Volumetric analysis of single microdroplets is difficult to perform by ensemble gravimetry, whereas optical microscopy is often inaccurate beyond the resolution

Tools and Instruments

Precision Imaging Facility

The Precision Imaging Facility (PIF) is a cooperative research facility at the National Institute of Standards and Technology (NIST) dedicated to the