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Gaithersburg

NIST Handbook 133 - Current Edition

NIST Handbook 133 Checking the Net Contents of Packaged Goods. Current Edition - 2026 as adopted by the 109th National Conference on Weights...

Infrastructure for Agile Manufacturing Data Standards

Manufacturing systems need to transform towards a new service-oriented architecture to benefit from new smart manufacturing technologies such as IIoT, AI, and

Advanced Manufacturing Data Infrastructure and Analytics Program

The Advanced Manufacturing Data Infrastructure and Analytics (AMDIA) program will lay the groundwork for advanced data infrastructure to improve the

NIST Handbook 130 - Current Edition

NIST Handbook 130 Uniform Laws and Regulations in the Areas of Legal Metrology and Fuel Quality. Current Version - 2026 as adopted by the...

Integrated Lentiviral Vector Copy Number Measurements: Invitation to Participate in an Interlaboratory Testing Program Evaluating Genomic DNA Test Materials

NIST invites participants to an Interlaboratory Testing Program to evaluate the suitability and utility of the genomic DNA test materials to serve as reference

Microplastic and Nanoplastic Metrology

The focus of the Micro and Nanoplastic (MNP) Metrology Project is to assist stakeholders measurements of plastic particles (< 10 micrometers) through

Workshops on Cybersecurity Labeling of Consumer Products

Cybersecurity Labeling for Consumer IoT and Software: Executive Order Update and Discussion - December 9, 2021 Improving the Nation’s...

Baldrige 2022 Examiner Application Now Open

November 29, 2021

The Baldrige Performance Excellence Program® (BPEP) is seeking applicants for the Malcolm Baldrige National Quality Award® Board of Examiners for the 2022 award...

NIST Helps OMG Update a Simulations Standard, Improving System Engineering

November 29, 2021

Disclaimer: Any mention of commercial products within NIST web pages is for information only; it does not imply recommendation or endorsement by NIST. The...

5785 MidAmerica Measurement Assurance Program (MidMAP)

Mon, Sep 26 - Thu, Sep 29 2022

NIST Handbook 143, Program Handbook (2019) details the criteria used for OWM Laboratory Recognition. NIST Handbook 143

5784 Southwest Assurance Program (SWAP)

Mon, Sep 12 - Thu, Sep 15 2022

NIST Handbook 143, Program Handbook (2019) details the criteria used for OWM Laboratory Recognition. NIST Handbook 143

5783 Northeast Measurement Assurance Program (NEMAP)

Mon, Jun 13 - Thu, Jun 16 2022

NIST Handbook 143, Program Handbook (2019) details the criteria used for OWM Laboratory Recognition. NIST Handbook 143

5782 Western Regional Assurance Program (WRAP)

Mon, May 16 - Thu, May 19 2022

NIST Handbook 143, Program Handbook (2019) details the criteria used for OWM Laboratory Recognition. NIST Handbook 143

2022 IEEE Fellow - Mark Stiles

For contributions to spintronics devices and data storage.

5781 Southeast Measurement Assurance Program (SEMAP)

Mon, Mar 28 - Thu, Mar 31 2022

NIST Handbook 143, Program Handbook (2019) details the criteria used for OWM Laboratory Recognition. NIST Handbook 143

Streamlined NIST Tool Could Help Homeowners, Renters Reduce Airborne Exposure to COVID

November 24, 2021

COVID-19 is still circulating in the U.S. and may once again gain traction as families and friends gather indoors over the holidays. There are several measures...

MML researchers develop reference materials and methods for quantitative phase microscopy with off-the-shelf products

Measurement Assurance for Quantitative Cell Imaging by Optical Microscopy

An Introduction to the Common Data Format Project

This page presents an introduction to the common data format (CDF) project and answers the question, why is a CDF needed? It starts with a...

2021 Highly Cited Researcher - Hui Wu

Recognizing the true pioneers in their fields over the last decade, demonstrated by the production of multiple highly-cited papers that rank in the top 1% by citations for field and year in the Web of Science™ https://publons.com/researcher/1571487...

2021 Highly Cited Researcher - Wei Zhou

Recognizing the true pioneers in their fields over the last decade, demonstrated by the production of multiple highly-cited papers that rank in the top 1% by citations for field and year in the Web of Science™ https://publons.com/researcher/1566207...

Circular Economy

NIST’s Circular Economy Program leverages expertise in measurement science, standards, and technology to support stakeholders in addressing circular supply chain challenges.

Read more about Baldrige Award FAQs

Million Pounds-Force Deadweight Machine

Measuring Up: NIST Calibrates Masses for Unique Air Force Deadweight Machines

November 18, 2021

Mechanical engineers at the National Institute of Standards and Technology (NIST) have just finished calibrating several dozen large metal masses, which will be...

Education

Manufacturing Myths – Debunked!

Four common myths about the manufacturing industry are debunked with the data and MEP National Network success stories that prove otherwise...

5780 Information Session: Metric System Estimation

Thu, Feb 23 2023, 7:00 - 8:30pm EST

The International System of Units (SI), commonly known as the metric system, is easy to use and learn when taught using

Impeding the Impedance: Research Reveals How to Design a Better Next-Generation Lithium-Ion Battery

November 16, 2021

The newest generation of lithium-ion batteries now under development promises a revolution in powering cell phones, electric vehicles, laptops and myriad other...

The 27th CHRNS School on Methods and Applications of Neutron Spectroscopy

Fri, Jan 28 - Fri, Feb 11 2022

Please Note: This page is intended to facilitate registration of people that have been selected from a competitive

5779 Information Session: Metric System Education Resources

Thu, Feb 9 2023, 7:00 - 8:30pm EST

The International System of Units (SI), commonly known as the metric system, is easy to use and learn when taught using

5778 Measurement System Basics: SI & U.S. Customary Units for Regulatory Officials

Thu, Nov 17 2022, 2:00 - 3:30pm EST

This 1.5 hour webinar will introduce the measurement systems commonly used in the United States, including the

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