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Gaithersburg

Computational Science, Applied Mathematics

Speakers Jeffrey Fong Title of Talk: WHY ENGINEERS NEED TO KNOW HOW TO SOLVE EQUATIONS "EXACTLY" USING A COMPUTER Topic Areas: Algebraic...

Artificial Intelligence/Machine Learning

Speakers Peter Bajcsy Title of Talk: MEASUREMENTS OF CLASS ENCODINGS IN NEURAL NETWORKS Topic Areas: neural networks, artificial...

Engagement with Universities and Colleges

Innovation is paramount at ITL and can only be achieved through the diversification of ideas. This outreach is intended to expand our...

NanoFab Tool: Reactive Ion Etcher 790 Nitride Left

This PlasmaTherm 790 reactive ion etcher (RIE) is a parallel plate plasma etching system which uses fluorocarbon and oxygen gases to etch silicon nitride thin

Icon of clipboard with check marks and an x

OWM Launches New Metrology Training Needs Survey

March 25, 2022

The Office of Weights and Measures (OWM) is a relatively small office at NIST, but has a big footprint in the weights and measures community. With just over 20...

The Future is Charged: U.S. Electric Vehicle Infrastructure

March 29, 2022 - September 30, 2022

Please see the Electric Vehicle Supply Equipment Program on the NIST OWM website for any current updates on NIST standards, measurement services, and training...

Graphic Image of Weights and Measurements Featured Collection

Discover NIST Education Resources!

March 27, 2022

The National Institute of Standards and Technology (NIST) invites learners of all ages to explore and discover a wide variety of Science, Technology...

ACMD Seminar: Discrete Optimization Techniques for Network and Data Analysis

Illya Hicks Computational and Applied Mathematics Department, Rice University Tuesday, April 26, 3:00-4:00 EDT (1:00-2:00 MDT) A video of...

Radio Access and Propagation Metrology Group

Wireless Systems Innovation and Performance Group

Collaborates with government, industry, and academia to design, evaluate, and standardize future wireless networks that are robust, interoperable, intelligent, and high-performing.

Ultraviolet Light Can Clean N95 Masks for Reuse Without Hindering Performance, NIST Study Shows

March 25, 2022

To combat COVID-19 amid supply shortages in 2020, health care facilities across the U.S. resorted to disinfecting personal protective equipment (PPE), such as...

Photo of a student working in the laboratory

We're Back... OWM Welcomes Laboratory Metrology Students to Campus!

March 28, 2022

NIST Office of Weights and Measures (OWM) resumed limited in-person laboratory metrology training at the Gaithersburg campus starting on January 31, 2022. We...

NIST-MSU STEM Symposium

Thu, Mar 24 2022, 9:00am - 2:30pm EDT

The Science, Technology, Engineering and Mathematics (STEM) Symposium is a virtual forum to strengthen ties between NIST

OWM Welcomes New Associate, María Peñahora Cañeque Simón

María received her master’s degree in electrical engineering from Pontificia Comillas University ICAI, in Madrid, Spain in 2012. After three...

World Metrology Day Poster Graphic Image

Celebrate World Metrology Day on May 20

March 26, 2022

“World Metrology Day is an annual celebration of the signature of the Meter Convention on 20 May 1875 by representatives of seventeen nations. The Convention...

ITL Speakers Bureau: James Lyle

Title of Talk: OVERVIEW OF DIGITAL FORENSICS ABSTRACT: Following A Tasty Case Natasha Romanov (former secret agent) has retired and opened a...

Setting the Standards: Strengthening U.S. Leadership in Technical Standards

March 17, 2022

Referenced Speaker

James K. Olthoff

Introduction Chairwoman Stevens, Ranking Member Feenstra, and members of the Subcommittee, I am Dr. James Olthoff, Performing the Non-Exclusive Functions and...

Not Letting It Slip By: NIST Discovery Could Increase Accuracy in Measuring Blood Flow for Cancer Diagnosis, Other Applications

March 22, 2022

Researchers at the National Institute of Standards and Technology (NIST) have discovered a potential source of error when using acoustic waves to measure the...

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Gaithersburg

Computational Science, Applied Mathematics

Artificial Intelligence/Machine Learning

Engagement with Universities and Colleges

NanoFab Tool: Reactive Ion Etcher 790 Nitride Left

OWM Launches New Metrology Training Needs Survey

The Future is Charged: U.S. Electric Vehicle Infrastructure

Discover NIST Education Resources!

ACMD Seminar: Discrete Optimization Techniques for Network and Data Analysis

Radio Access and Propagation Metrology Group

Wireless Systems Innovation and Performance Group

Ultraviolet Light Can Clean N95 Masks for Reuse Without Hindering Performance, NIST Study Shows

We're Back... OWM Welcomes Laboratory Metrology Students to Campus!

NIST-MSU STEM Symposium

OWM Welcomes New Associate, María Peñahora Cañeque Simón

Celebrate World Metrology Day on May 20

ITL Speakers Bureau: James Lyle

Setting the Standards: Strengthening U.S. Leadership in Technical Standards

Not Letting It Slip By: NIST Discovery Could Increase Accuracy in Measuring Blood Flow for Cancer Diagnosis, Other Applications

George Awad

NIST Seeks Comments on Draft AI Risk Management Framework, Offers Guidance on AI Bias

Updates and Reports Relating to Feb. 3, 2021, Alert at NIST’s Research Reactor

Nuclear Regulatory Commission Releases Special Inspection Report on 2021 Alert at the NIST Research Reactor

Cancer

Revamped Design Could Take Powerful Biological Computers From the Test Tube to the Cell

NIST AI Measurement and Evaluation Projects

AI Metrology Colloquia Series

5813 Weights and Measures Inspections - Evidence, Search and Seizure, and Due Process

Ran Tao Recognized as a 2022 PMSE Young Investigator by ACS

There’s More to AI Bias Than Biased Data, NIST Report Highlights

Iris Experts Group (IEG) Meeting 2022