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Gaithersburg

Experimental Evaluation of Large-Scale Parallel Measurement Systems

Measurement systems such as those based on microarrays routinely produce thousands of parallel data sets. This project seeks to develop an approach to

Uncertainty analysis for autocorrelated measurement data

Develop statistical approaches to assess uncertainties for various autocorrelated measurement data.

Graphene Yields Secrets to Its Extraordinary Properties

May 20, 2009

Applying innovative measurement techniques, researchers from the Georgia Institute of Technology and the National Institute of Standards and Technology (NIST)

SED Publications

Archived Publications of the Statistical Engineering Division Each year the staff of the Statistical Engineering Division produces an annual...

NIST Physicist Receives APS I.I. Rabi Prize

November 9, 2006

The American Physical Society (APS) announced last week the selection of National Institute of Standards and Technology (NIST) physicist Jun Ye, to receive the

NIST Staff Honored in 2006 Presidential Rank Awards

November 9, 2006

Five senior members of the National Institute of Standards and Technology (NIST) staff have been honored in the 2006 Presidential Rank Awards. The awards

Steven Bellovin to Receive NIST/NSA Security Award

November 9, 2006

Steven M. Bellovin, a pioneer researcher on network security, will be presented with the 2007 National Information Systems Security Award by the National

2006 Machine Translation Evaluation Results Posted

November 9, 2006

The National Institute of Standards and Technology (NIST) has posted the results of the NIST 2006 Machine Translation Evaluation (MT-06), part of an ongoing

NIST Issues Info Security Primer for Managers

November 9, 2006

Heads of federal agencies, chief information officers and any manager who needs a broad overview on information security practices will be interested in a new

New Measurement Guide Worth 'Poring Over'

November 9, 2006

In industries from textiles to automobiles and from pharmaceuticals to semiconductors, accurately measuring empty spaces—technically speaking, porosity—is a

Vulnerability Database Hits 20,000 Software-Flaw Mark

October 26, 2006

Established just a little over a year ago, the National Institute of Standards and Technology's (NIST) National Vulnerability Database (NVD) now contains

Statistics for Ballistics Identification

NIST is making advances in the science and technology for identification of firearms and tool marks; SED provides statistical analyses and designs as a vital

Turning a Nuclear Spotlight on Illegal Weapons Material

October 26, 2006

Researchers at the National Institute of Standards and Technology (NIST) and Oak Ridge National Laboratory (ORNL) have demonstrated that they can cheaply

NIST Releases New Standard for Semiconductor Industry

October 12, 2006

A wide range of optical electronic devices, from laser disk players to traffic lights, may be improved in the future thanks to a small piece of semiconductor

Statistical Reference Datasets (StRD)

Summary: The Statistical Reference Datasets (StRD) provides a Web-based service that provides reference datasets with certified values for a...

NIST Issues Four-Pack of Computer Security Pubs

October 12, 2006

The National Institute of Standards and Technology recently issued four publications to provide computer security advice on issues ranging from securing Windows

Fifteen Prepare for Baldrige Site Visits

September 28, 2006

Starting Oct. 16, teams of business, education and health care experts will visit 13 organizations—one service company, three small businesses, three education

Comments Sought on New IT Security Guides

September 28, 2006

On Sept. 26, 2006, the National Institute of Standards and Technology (NIST) released three draft information technology security publications for public

Washington Metro Region Nanotechnology Partnership Forum (9/2010)

Mon, Sep 13 2010

The intent of the forum is to foster collaboration and potential partnerships among federal laboratories, academia, and

ANSI/NIST-ITL Standard

The standard specifies formats to be used for exchanging fingerprint and other image data.

Purchase and Download

Effective immediately, there will be a minimum $30.00 shipping charge for all international shipments of databases via UPS International...

NIST Physicist Awarded Service to America Medal

September 28, 2006

Dr. William D. Phillips, the first researcher from the National Institute of Standards and Technology (NIST) to become a Nobel Laureate, has been awarded the

e-Statistics

e-FITS ( link currently only accessible to NIST staff) is a web-based tool used to generate graphs, tables, and random numbers for a large number of probability

Model Homes Offer National IAQ Impact Results

September 28, 2006

Airborne contaminants in homes can range from allergic agents such as mold to potentially lethal threats such as carbon monoxide. Engineers at the National

Firefighter Radios May Fail During High-Temp Fires

September 28, 2006

Firefighters sometimes find themselves fighting blazes in temperatures as high as 500 degrees F (260 degrees C). Firefighter gear and self-contained breathing

NIST Guide Details Forensic Practices for Data Analysis

September 14, 2006

TV shows such as "CSI: Crime Scene Investigation" have popularized the role of forensic science in solving crimes. Now, computer security experts at the

ANSI/NIST-ITL Standard 2010 Workshop

The standard was first published in 1986 and focused on the exchange of fingerprint information. It has been updated several times, with the...

Nanomanufacturing Meeting to Chart Research Needs

September 14, 2006

Experts in manufacturing processes, measurement science and tools, and computational methods will meet Oct. 17-19, 2006, in Gaithersburg, Md., to set research

Cement Characteristics by Direct Phase Assessment

Worldwide, cement/concrete development and utilization represent significant measurable fractions of national GDP's. Over-reliance on dated modes of assessing

SED Consulting Program

The Statistical Engineering Division seeks opportunities to collaborate with NIST staff on research projects where optimal experiment design, statistical

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