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Gaithersburg

Statistical Support for Bioassay Standard Development

In this project, we investigate appropriate uncertainty analysis and splicing algorithms for spectral data, especially fluorescence spectroscopy calibration, to

NIST-led Research Group Creates First Whispering Gallery for Graphene Electrons

May 8, 2015

GAITHERSBURG, MD--An international research group led by scientists at the U.S. Commerce Department's National Institute of Standards and Technology (NIST) has...

Keynote Speakers

We are pleased to announce the Symposium's Keynote Speakers: Tuesday, July 21 - Morning Keynote - Brandon Mayfield - Practicing, Law Office...

Conducting an Effective Management Review

Thu, Feb 11 2016

This 2 hour webinar introduces the Laboratory Management Review process, an important tool to foster communication

Building a High-Tech Future Through Partnerships & Planning: Commerce's NIST Announces $7.8 Million in Advanced Manufacturing Technology Grants

May 8, 2015

Guest blog post by Michael F Molnar Director, Advanced Manufacturing Office, NIST The power and performance of the computer chip have improved like clockwork...

Document Control and Record Keeping

Thu, Aug 25 2016

This 2 hour webinar will introduce the fundamentals of Laboratory Management System Document Control and Record Keeping

Baldrige Leaders Recognized Among "Top 25 Women in Health Care"

May 7, 2015

Modern Healthcare's annual "Top 25 Women in Health Care 2015" list includes three health care leaders whose involvement with the Baldrige Performance Excellence...

OWM Examination Procedure Outlines (EPOs)

A portion of the Examination Procedure Outlines (EPOs) in this collection are current to the 2025 edition of NIST Handbook 44. These are...

Contract Review

Thu, Aug 4 2016

This 2 hour webinar will introduce the fundamentals of contract review that are necessary to meet customer expectations

Mass Metrology Seminar

Mon, Mar 7 - Fri, Mar 18 2016

The Mass Metrology Seminar is a 2 week, "hands-on" seminar. It incorporates approximately 30 percent lectures and 70

Mass Metrology Seminar-Cancelled

Mon, May 16 - Fri, May 27 2016

The Mass Metrology Seminar is a 2 week, "hands-on" seminar. It incorporates approximately 30 percent lectures and 70

SIM Participants ONLY - Fundamentals of Metrology

Mon, Apr 4 - Fri, Apr 8 2016

The Fundamentals of Metrology seminar will introduce the participant to the concepts of measurement systems, units

NIST Awards $7.8 Million for Advanced Manufacturing Technology Planning Grants

May 7, 2015

GAITHERSBURG, MD--The U.S. Commerce Department's National Institute of Standards and Technology (NIST) today announced 16 awards totaling $7.8 million to help...

NIST Contributes to IEC White Paper on Wireless Sensor Networks, IOT

May 6, 2015

A new white paper by an international team surveys the role of wireless sensor networks in the evolution of the Internet of Things (IoT). The report catalogs...

Two NIST Experts Named Service to America Medal Finalists

May 6, 2015

Two National Institute of Standards and Technology (NIST) researchers have been named finalists for 2015 Samuel J. Heyman Service to America Medals, which...

Go Figure: What Is the Most Efficient Design for New Single-Family Home?

May 6, 2015

What is the optimal energy efficiency design for a new single-family house? Two economists at the National Institute of Standards and Technology (NIST) took a...

Senate Confirms May as 15th NIST Director

May 5, 2015

Washington, D.C. – On May 4, 2015, the U.S. Senate confirmed Willie E. May as the second Under Secretary of Commerce for Standards and Technology and the 15th...

IREX datasets

The data used in IREX comes from publicly available datasets and from operational data provided by various branches of the US Government...

A Point Process Model for Evacuation Flows: The Hawkes Mode

The primary motivation for this work is the fire in the World Trade Center towers, which generated an urgent need to better understand evacuation procedures in

Statistics for Food and Supplement SRMs

SED has had a long and extensive collaboration with the Materials Measurement Laboratory in working toward the certification of standard reference materials

Photonic Thermometers: Out of the Lab, Into a Bucket of Water

April 28, 2015

A new class of tiny chip-based thermometers being developed by PML's Sensor Science Division has the potential to revolutionize the way temperature is gauged...

NIST Center for Neutron Research

A national user facility that advances economic and technical excellence in the U.S. by providing world-class neutron measurement capabilities to meet the needs of researchers from industry, academia, and government.

Engineering Laboratory

The Engineering Laboratory promotes U.S. innovation and industrial competitiveness by advancing measurement science, standards, and technology for engineered systems in ways that enhance economic security and improve quality of life.

Information Technology Laboratory

Cultivating Trust in IT and Metrology

NIST Seeks Community Input on Disaster Resilience Planning Guide

April 28, 2015

Guest blog post by Willie May, Acting Under Secretary of Commerce for Standards and Technology and Acting NIST Director. When disaster strikes, communities...

Statistical Process Monitoring for Autocorrelated Data

Develop statistical approaches to monitor process mean, process variability, and process capability indices for autocorrelated data.

Optics and Photonics: Essential for Our World

Wed, May 20 2015

The science and technology of light are essential to a multitude of applications that have transformed our society, and

Detecting Effects of 3D Shapes in Nanoscale Chip Features

April 27, 2015

As microchip feature dimensions approach atomic scale, it becomes formidably difficult to measure their size and shape. According to the International...

NIST Releases Draft Community Resilience Planning Guide for Public Review

April 27, 2015

Remarks by Dr. Willie E. May, Acting Under Secretary of Commerce for Standards and Technology and Acting NIST Director, at the Launch of the NIST Community...

Statistical Methods for Quantitative Imaging

Modern imaging systems produce massive amount of data that can be used to obtain critical 3D information on targeted measurement objects (nodules), including

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