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Search Publications by: Ann Chiaramonti Debay (Fed)

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Displaying 51 - 57 of 57

Towards the Integration of Carbon Nanotubes as Vias in Monolithic 3D Integrated Circuits

March 21, 2013
Author(s)
Ann C. Chiaramonti Debay, Sten Vollebregt, Johan van der Cingel , Kees Beenakker, R. Ishihara
Carbon nanotubes (CNT) can be an attractive candidate for vertical interconnects (vias) in 3D integrated circuits due to their excellent thermal and electrical properties. To investigate CNT electrical resistivity, test vias were fabricated using both a

Contact resistance of low-temperature carbon nanotube vertical interconnects

August 20, 2012
Author(s)
Ann C. Chiaramonti Debay, Sten Vollebregt, R. Ishihara, Hugo Schellevis, Kees Beenakker
In this work the electrical contact resistance and length dependant resistance of vertically aligned carbon nano- tubes (CNT) grown at 500 °C with high tube density (1011) are investigated by measuring samples with different CNT lengths. From scanning

Reliability Testing of Advanced Interconnect Materials

November 10, 2011
Author(s)
Robert R. Keller, Mark C. Strus, Ann C. Chiaramonti Debay, David T. Read, Younglae Kim, Yung J. Jung
We describe the development of electrical test methods to evaluate damage that determines reliability in advanced, small-scale conductors, including damascene copper and aligned carbon nanotube networks. Rapid thermal cycling induced during high-current AC

Homoepitaxial n-core: p-shell gallium nitride nanowires: HVPE overgrowth growth on MBE nanowires

October 25, 2011
Author(s)
Aric Sanders, Paul T. Blanchard, Kristine A. Bertness, Matthew D. Brubaker, Ann Chiaramonti Debay, Christopher M. Dodson, Todd E. Harvey, Andrew M. Herrero, Devin M. Rourke, John B. Schlager, Norman Sanford, Albert Davydov, Abhishek Motayed, Denis Tsvetkov
We present the homoepitaxial growth of p-type, magnesium-doped gallium nitride shells using halide vapor phase epitaxy on n-type gallium nitride nanowires grown by plasma-assisted molecular beam epitaxy. Scanning electron microscopy shows clear dopant

Electrical Reliability Testing of Single-Walled Carbon Nanotube Networks

May 18, 2011
Author(s)
Mark C. Strus, Ann C. Chiaramonti Debay, Robert R. Keller, Yung J. Jung, Younglae Kim
We present test methods to investigate the electrical reliability of nanoscale lines of highly-aligned, networked, metallic/semiconducting single-walled carbon nanotubes (SWCNTs) fabricated through a template-based fluidic assembly process. We find that

Effect of Annealing on Transport Properties of MgO-based Magnetic Tunnel Junctions

September 12, 2008
Author(s)
Ann Chiaramonti Debay, Daniel Schreiber, William F. Egelhoff Jr., D. N. Seidman, Amanda K. Petford-Long
The effect of annealing on the transport behavior of CoFe/MgO/CoFe magnetic tunnel junctions has been studied using a combination of site-specific in-situ transmission electron microscopy and three-dimensional atom probe tomography. Annealing at 340 °C for
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