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Search Publications by: Paul D. Hale (Fed)

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Displaying 76 - 100 of 116

Calibrated Measurement of Optoelectronic Frequency Response

April 1, 2003
Author(s)
Paul D. Hale, Dylan Williams
We describe a straightforward method for accurately measuring the frequency response of optoelectronic devices. The method uses a calibrated optical reference receiver, a modulated optical source, and a calibrated electrical vector network analyzer.

Broadband Characterization of Optoelectronic Components to 65 GHz Using VNA Techniques

January 1, 2003
Author(s)
M M. Maska, Jon Martens, Tracy S. Clement, Paul D. Hale, Dylan Williams
This paper discusses the typical uncertainties associated with characterizing high speed photodiodes to 65 GHz when using a vector network analyzer measurement technique. We analyzed the accuracy of the technique by comparing measurements of two reference

Calibrating Photoreceiver Response to 110 GHz

November 13, 2002
Author(s)
Tracy S. Clement, Dylan F. Williams, Paul D. Hale, Juanita M. Morgan
We have measured the magnitude and phase responses of a photoreceiver to 110 GHz using a calibrated electro-optic sampling system. The frequency range of the calibration is limited only by our 1 mm coaxial connectors.

Uncertainty of Oscilloscope Timebase Distortion Estimate

February 1, 2002
Author(s)
Chih-Ming Wang, Paul D. Hale, Kevin Coakley, Tracy S. Clement
We study several problems related to the characterization of the timebase in high-speed sampling oscilloscopes. First, we examine the bias of using the method of the first-order approximation to estimate the additive and time jitter noises, and present a

Fiber and Component Metrology for High-Speed Communications

January 1, 2002
Author(s)
Tracy S. Clement, Paul D. Hale, Paul A. Williams
Increased data rates require improved measurements. We give specific guidance to avoid measurement pitfalls in two critical high data rate areas: Polarization-mode dispersion and transmitter/receiver frequency response. For audiences familiar (not expert)

Measuring the Frequency Response of Gigabit Chip Photodiodes

September 1, 2001
Author(s)
Paul D. Hale, Tracy S. Clement, Dylan F. Williams, E. Balta, N. D. Taneja
We describe a calibratin and measurement procedure for determining the intrinsic frequency response fo gigabit chip photodiodes embedded in simple test fixtures. The procedure is unique because we make the measurements in the time-domain using a calibrated

Calibrating Electro-Optic Sampling Systems

May 1, 2001
Author(s)
Dylan Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We apply frequency-domain impedance mismatch corrections to a temporal electro-optic sampling system. We identify and evaluate additional sources of measurement uncertainty. We use the system to characterize the magnitude and phase response of a

Frequency Response Metrology for High-Speed Optical Receivers

March 1, 2001
Author(s)
Paul D. Hale, Tracy S. Clement, Dylan F. Williams
There are two types of optical sources whose modulation can be measured or calculated from fundamental principles: the hererodyne beat between two single- frequency lasers (frequency-domain) and the short pulse from a mode-locked laser (time-domain). While

Alignment of Noisy Signals

February 1, 2001
Author(s)
Kevin J. Coakley, Paul D. Hale
We study the relative performance of various methods for aligning noisy one dimensional signals. In each method, we estimate the relative shifts of a set of signals which are translated with respect to each other. We simulate signals corrupted by both

Mismatch Corrections for Electro-Optic Sampling Systems

December 1, 2000
Author(s)
Dylan F. Williams, Paul D. Hale, Tracy S. Clement, Juanita M. Morgan
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the

Analysis of Interconnection Networks and Mismatch in the Nose-to-Nose Calibration

June 1, 2000
Author(s)
Donald C. DeGroot, Paul D. Hale, M. Vanden Bossche, F. Verbeyst, Jan Verspecht
We analyze the input networks of the samplers used in the nose-to-nose calibration method. Our model demonstrates that the required input network conditions are satisfied in this method and shows the interconnection errors are limited to measurement