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Displaying 101 - 125 of 162

Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media

August 12, 2013
Author(s)
De-Hao D. Tsai, Frank W. DelRio, John M. Pettibone, Pin A. Lin, Jiaojie Tan, Michael R. Zachariah, Vincent A. Hackley
In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) in the

On the bending strength of single-crystal silicon theta-like specimens

July 10, 2013
Author(s)
Rebecca R. Kirkpatrick, William Alexander Osborn, Michael S. Gaither, Richard S. Gates, Frank W. DelRio, Robert F. Cook
A new theta geometry was developed for micro-scale bending strength measurements. The new "gap" theta specimen was a simple modification of the arch theta specimen that enabled micro-scale tensile testing. The gap theta was demonstrated here on single

Effect of Organic SAMs on the Evolution of Strength of Silicon Nanostructures

June 3, 2013
Author(s)
Scott Grutzik, Brian G. Bush, Frank W. DelRio, Richard S. Gates, Melissa Hines, Alan Zehnder
The ability to accurately predict the strength of nanoscale, single crystal structures is critical in micro- and nano-electromechanical systems (MEMS and NEMS) design. Because of the small length scales involved failure does not always follow the same

Controlled Chemistry for Studying Combined Effects of Extracellular Matrix Proteins

April 22, 2013
Author(s)
Antony K. Chen, Frank W. DelRio, Alexander W. Peterson, Koo-Hyun Chung, Kiran Bhadriraju, Anne L. Plant
The extracellular matrix (ECM) consists of a complex mixture of biochemical and physical stimuli that together regulate cell behavior. Previously we showed that films composed of Type I collagen fibrils induce reproducible and physiologically relevant cell

Interfacial Mechanical Properties of n-Alkylsilane Monolayers on Silicon Substrates

February 1, 2013
Author(s)
Brian G. Bush, Frank W. DelRio, Cherno Jaye, Daniel A. Fischer, Robert F. Cook
The interfacial properties of n-alkylsilane self-assembled monolayers on silicon were investigated by normal force spectroscopy and lateral force measurements and correlated with molecular structure via near-edge X-ray absorption fine structure (NEXAFS)

Quantifying Dithiothreitol Displacement of Functional Ligands from Gold Nanoparticles

October 27, 2012
Author(s)
De-Hao D. Tsai, Frank W. DelRio, Sherrie R. Elzey, Suvajyoti S. Guha, Michael R. Zachariah, Vincent A. Hackley, Melanie P. Shelton
Dithiothreitol (DTT)-based displacement is widely utilized for separating ligands from their gold nanoparticle (AuNP) conjugates, a critical step for differentiating and quantifying surface-bound functional ligands and therefore the effective surface

Tumor Necrosis Factor Interaction with Gold Nanoparticles

March 14, 2012
Author(s)
De-Hao D. Tsai, Sherrie R. Elzey, Frank W. DelRio, Robert I. MacCuspie, Suvajyoti S. Guha, Michael R. Zachariah, Athena M. Keene, Jeffrey D. Clogston, Vincent A. Hackley
We report on a systematic investigation of molecular conjugation of tumor necrosis factor protein-α (TNF) onto gold nanoparticles (AuNPs) and the subsequent binding behavior to its antibody (anti-TNF). We employ a combination of physical and spectroscopic

Nanomechanical properties of polyethylene glycol brushes on gold substrates

February 15, 2012
Author(s)
Gheorghe NMN Stan, Frank W. DelRio, Robert I. MacCuspie, Robert F. Cook
Brushes of polyethylene glycol (PEG) were directly anchored onto bare gold substrates in solution. The nucleation kinetics of PEG binding were investigated successively in solution and dry air using atomic force microscopy (AFM) imaging. In addition, force

Size Measurement of Nanoparticles Using Atomic Force Microscopy, ASTM E2859-11

January 2, 2012
Author(s)
Jaroslaw Grobelny, Frank W. DelRio, Pradeep Namboodiri, Doo-In Kim, Vincent A. Hackley, Robert F. Cook
The purpose of this document is to provide guidance on the quantitative application of atomic force microscopy (AFM) to determine the size of nanoparticles2 deposited in dry form on flat substrates using height (z-displacement) measurement. Unlike electron