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Search Publications by

R Joseph Kline (Fed)

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Displaying 1 - 25 of 81

Acoustoelasticity, Theory and Experiment

October 12, 2021
L Jiang, Regis J. Kline, Y Yacobi, E Drescher-Krasicka
As a promising tool to characterize residual stress in engineering structural components, acoustoelasticity has been the subject of a great deal of research over the past forty years. Although considerable achievements have been derived, most approaches of

X-Ray Metrology of Nanowire/ Nanosheet FETs for Advanced Technology Nodes

March 30, 2020
Madhulika S. Korde, Regis J. Kline, Daniel Sunday, Nick Keller, Subhadeep Kal, Cheryl Alix, Aelen Mosden, Alain C. Diebold
The three-dimensional architectures for field effect transistors (FETs) with vertical stacking of Gate-all-Around Nanowires provide a pathway to increased device density and superior electrical performance. However, the transition from research into

Influence of Polymer Aggregation and Liquid Immiscibility on Morphology Tuning by Varying Composition in PffBT4T-2DT/Non-Fullerene Organic Solar Cells

January 29, 2020
Subhrangsu Mukherjee, Dean M. DeLongchamp, Regis J. Kline, Iain McCulloch, Zeinab Hamid, Andrew Wadsworth, Elham Rezasoltani, Sarah Holliday, Mohammed Azzouzi, Anne Guilbert, Yifan Dong, Marios Neophytou, Mark Little, Helen Bristow, Artem Bakulin, James Durrant, Jenny Nelson, Andrew A. Herzing
The temperature dependent aggregation behavior of PffBT4T polymers used in organic solar cells plays a critical role in the formation of a favorable morphology in fullerene-based devices. However, there has been little investigation into the impact of

X-ray Metrology for the Semiconductor Industry Tutorial

February 1, 2019
Daniel F. Sunday, Wen-Li Wu, Scott Barton, Regis J. Kline
The semiconductor industry is in need of new, in-line dimensional metrology methods with higher spatial resolution for characterizing their next generation nanodevices. The purpose of this short course is to train the semiconductor industry on the NIST

Metrology for the next generation of semiconductor devices

October 12, 2018
Ndubuisi G. Orji, Mustafa Badaroglu, Bryan M. Barnes, Carlos Beitia, Benjamin D. Bunday, Umberto Celano, Regis J. Kline, Mark Neisser, Yaw S. Obeng, Andras Vladar
The semiconductor industry continues to produce ever smaller devices that are ever more complex in shape and contain ever more types of materials. The ultimate sizes and functionality of these new devices will be affected by fundamental and engineering

Advancing the computational methodology of rigid rod and semiflexible polymer systems: A new solution to the wormlike chain model with rod-coil copolymer calculations

October 3, 2018
Adam F. Hannon, Regis J. Kline, Dean DeLongchamp
A wormlike chain model for rod type blocks in a rod‐coil diblock copolymer is implemented in the self‐consistent field theory (SCFT) formalism. A pseudo‐spectral method is used to solve for the single‐chain partition function of this copolymer system

Xi-cam: A versatile interface for data visualization and analysis

April 13, 2018
Ronald Pandolfi, Dinesh Kumar, Guillaume Freychet, Holden Parks, Singanallur venkatakrishnan, Austin Blair, shreya Sahoo, Stefano marchesini, Christopher D. Liman, Daniel Sunday, Lenson Pellouchoud, Christopher Tassone, dilworth parkinson, Sean Fackler, Zhang Jiang, Apurva Mehta, Masafumi Fukuto, Kevin G. Yager, Regis J. Kline, Joseph Strzalka, Thomas Caswell, daniel Allan, Stuart Campbell, James Sethian, Harinarayan Krishnan, Alexander Hexemer

Blade Coating Aligned, High-Performance, Semiconducting-Polymer Transistors

February 22, 2018
Lee J. Richter, Hyun W. Ro, Regis J. Kline, Daniel A. Fischer, Dean M. DeLongchamp, Lars Thomsen, Christopher McNeil, Dawei Wu, Maria Kaplan, Eliot H. Gann
Recent demonstration of mobilities in excess of 10 cm2V-1s-1 have energized research in solution deposition of polymers for thin film transistor applications. Due to the lamella motif of most soluble, semiconducting polymers, the local mobility is

Optimizing Self-Consistent Field Theory Block Copolymer Models with X-Ray Metrology

February 12, 2018
Adam F. Hannon, Daniel Sunday, Alec Bowen, Gurdaman Khaira, Jiaxing Ren, Paul Nealey, Juan de Pablo, Regis J. Kline
A block copolymer self-consistent field theory (SCFT) model is used for direct analysis of experimental X-ray scattering data obtained from thin films of polystyrene-b-poly(methyl methacrylate) (PS-b-PMMA) made from directed self-assembly. In a departure

Modeling the polarized X-ray scattering from periodic nanostructures with molecular anisotropy

December 1, 2017
Christopher D. Liman, Thomas A. Germer, Daniel F. Sunday, Dean M. DeLongchamp, Regis J. Kline
We discuss a new technique to measure molecular orientation in nanostructures using resonant soft X-rays. This technique is based on a variable angle transmission measurement called critical dimension X-ray scattering that enables the characterization of

The dependence of electrical performance on structural organization in low mobility polymer field effect transistors

April 16, 2017
Emily G. Bittle, Hyun W. Ro, Chad R. Snyder, Sebastian Engmann, Regis J. Kline, Oana Jurchescu, Dean M. DeLongchamp, David J. Gundlach
Polymer semiconductors are contenders for use in printed, flexible electronics. Though organic electronic materials have been studied for many years, the physics of charge transport is still under investigation. This is in part due to the large variability