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A NIST facility for Resonant Soft X-ray Scattering measuring nano-scale soft matter structure at NSLS-II



Eliot Gann, Glenn Holland, R Joseph Kline, Peter Beaucage, Dean DeLongchamp, Daniel A. Fischer, Brian Collins, Terry McAfee, Christopher McNeill, Thomas Crofts


We present the design and performance of a Resonant Soft X-ray Scattering (RSoXS) station designed for soft matter characterization built by the National institute of Standards and Technology (NIST) at the National Synchrotron Light Source-II (NSLS-II). The RSoXS station is located within the Spectroscopy Soft and Tender (SST) beamline suite at NSLS-II located in Brookhaven National Laboratory, New York. Numerous elements of the RSoXS station were designed for optimal performance of soft matter systems, where it is of critical importance to minimize beam damage and maximize collection efficiency of polarized X-rays. These elements include a novel optical design, sample manipulator and sample environments, as well as detector setups. Finally, we will report the performance of the measurement station, including energy resolution, higher harmonic content and suppression methods, the extent and mitigation of the carbon absorption dip on optics, and the range of polarizations available from the elliptically polarized undulator source.
Journal of Physics Condensed Matter


Resonant Soft X-ray Scattering, X-ray scattering, Beamline, Soft Matter, NEXAFS, spectroscopy


Gann, E. , Holland, G. , Kline, R. , Beaucage, P. , DeLongchamp, D. , Fischer, D. , Collins, B. , McAfee, T. , McNeill, C. and Crofts, T. (2021), A NIST facility for Resonant Soft X-ray Scattering measuring nano-scale soft matter structure at NSLS-II, Journal of Physics Condensed Matter, [online], (Accessed June 19, 2024)


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Created January 26, 2021, Updated October 14, 2022