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Search Publications by: Lee L. Yu (Fed)

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Displaying 51 - 72 of 72

Certification of Three NIST Renewal Soil Standard Reference Materials(R) for Element Content: SRM 2709a San Joaquin Soil, SRM 2710a Montana Soil I, and SRM 2711a Montana Soil II

June 1, 2010
Author(s)
Elizabeth A. Mackey, Christopher S. Johnson, Richard M. Lindstrom, Stephen E. Long, Anthony F. Marlow, Karen E. Murphy, Rick L. Paul, Rachel S. Popelka-Filcoff, Savelas A. Rabb, John R. Sieber, Rabia Oflaz, Bryan E. Tomlin, Laura J. Wood, James H. Yen, Lee L. Yu, Rolf L. Zeisler, S. A. Wilson, M. G. Adams, Z. A. Brown, P. L. Lamothe, J. E. Taggart, C. Jones, J. Nebelsick
For the past 20 y, the National Institute of Standards and Technology has provided three soil Standard Reference Materials certified for element content: SRM 2709 San Joaquin Soil (Baseline Trace Element Concentrations); SRM 2710 Montana Soil I (Highly

Characterization of SiGe Films for use as a National Institute of Standards and Technology (NIST) Microanalysis Reference material (RM 8905)

February 1, 2010
Author(s)
Ryna B. Marinenko, Shirley Turner, David S. Simons, Savelas A. Rabb, Rolf L. Zeisler, Lee L. Yu, Dale E. Newbury, Rick L. Paul, Nicholas W. Ritchie, Stefan D. Leigh, Michael R. Winchester, Lee J. Richter, Douglas C. Meier, Keana C. Scott, D Klinedinst, John A. Small
Bulk SiGe wafers cut from single-crystal boules and two SiGe thick films (4 m and 5 m thick) on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference materials needed by the

Purity determination as needed for the realisation of primary standards for elemental determination - status of international comparability

July 9, 2009
Author(s)
Gregory C. Turk, Heinrich Kipphardt, Ralf Matschat, Jochen Vogl, Tamara Gusarova, Michael Czerwensky, Hans-Joachim Heinrich, Akiharu Hioki, Leonid A. Konopelko, Brad Methven, Tsutomu Miura, Ole Petersen, Gundel Riebe, Ralph Sturgeon, Lee L. Yu
Within the National Metrology Institutes (NMIs) and designated laboratories, an interlaboratory comparison, CCQM-P107, was conducted to verify the degree of international comparability concerning the results of purity analysis. The mass fractions of Ag, Bi

Electron Microprobe Characterization of Si-Ge Alloys and Films for Use as Microanalysis Reference Materials

October 16, 2008
Author(s)
Ryna B. Marinenko, Shirley Turner, Dale E. Newbury, Robert L. Myklebust, Lee L. Yu, Rolf L. Zeisler, David S. Simons, John A. Small
Bulk SiGe wafers cut from single-crystal boules and SiGe thick films on Si wafers were evaluated with the electron probe microanalyzer for the extent of heterogeneity and composition for use as reference standards needed by the microelectronics industry in

Detection Limit of Isotope Dilution Mass Spectrometry

August 1, 2002
Author(s)
Lee L. Yu, John D. Fassett, William F. Guthrie
The detection limit is an important figure of merit for evaluating instrumentation and analytical methods. While the detection limit for techniques using linear calibration functions has been studied extensively, this fundamental metric has rarely been