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Search Publications by: Chad R. Snyder (Fed)

Displaying 126 - 150 of 157

Polymers Division Materials Science and Engineering Laboratory FY 2002 Programs and Accomplishments

September 1, 2002

Author(s)

Eric J. Amis, B M. Fanconi, Chad R. Snyder

The advent of controlled polymerization, advanced electronics, biomimetic materials, nanostructured systems, and a range of other new avenues for polymeric materials has raised the bar for measurements and standards research. This report of the 2002

Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology

February 1, 2002

Author(s)

Chad R. Snyder, J P. Looney, F A. Moris

This report catalogs the efforts of the National Institute of Standards and Technology (NIST) in nanotechnology during FY 2001. The purpose of this report is to provide a snapshot of current efforts in nanotechnology at NIST and in doing so allow one to

Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology.

January 1, 2002

Author(s)

Chad R. Snyder, J P. Looney, M P. Casassa

NIST Recommended Practice Guide: Capacitance Cell Measurement of the Out-of-Plane Expansion of Thin Films

November 1, 2001

Author(s)

Chad R. Snyder, F I. Mopsik

The coefficient of thermal expansion (CTE) continues to be a critical parameter in modeling for the microelectronics industry. Over the past several years, NIST has worked to develop a robust and highly accurate means for determined the CTE of polymer

A Precision Capacitance Cell for Measurement of Thin Film Out-of-Plane Expansion Part III. Conducting and Semiconducting Materials

October 1, 2001

Author(s)

Chad R. Snyder, F I. Mopsik

This paper describes the construction, calibration, and use of a precision capacitance-based metrology for the measurement of the thermal and hygrothermal (swelling) expansion of thin films. It is demonstrated that with this version of our capacitance cell

High Sensitivity Technique for Measurement of Thin Film Out-of-Plane Expansion. II. Conducting and Semiconducting Samples

January 1, 2001

Author(s)

Chad R. Snyder

Determination of the Dielectric Constant of Nanoparticles. I. Dielectric Measurements of Buckminsterfullerene Solutions

November 1, 2000

Author(s)

Chad R. Snyder, Jack F. Douglas

The static dielectric constant ε of buckminsterfullerene C 60 particles is determined in cis-decalin, toluene, and 1,2-dichlorobenzene using continuum models for spherical and sherical shell inclusions. The value for ε for isolated C 60 in cis-decalin and

Determination of the Dielectric Constant of Nanoparticles. 1. Dielectric Measurements of Buckminsterfullerene Solutions

January 1, 2000

Author(s)

Chad R. Snyder, Jack F. Douglas

Time-Domain Dielectric Spectroscopy Analysis of the Amorphous Phase in Semicrystalline Polycarbonate

August 1, 1999

Author(s)

Chad R. Snyder, F I. Mopsik, H Marand, S M. Sohn

The amorphous state of bisphenol-A polycarbonate was examined by time-domain dielectric spectroscopy as a function of crystallization time over a frequency range of 1 x 10 -4 Hz to 1 x 10 4 Hz. The dielectric measurements were performed in the temperature

A Critical Comparison Between Time and Frequency Domain Relaxation Functions

July 1, 1999

Author(s)

Chad R. Snyder, F I. Mopsik

Considerable work has been performed on providing a theoretical basis for the KohlrauschWilliamsWatts (KWW) and HavriliakNegami(HN) relaxation functions. Because of this, several papers have examined the ''interconnection'' of these two functions. In this

A Precision Capacitance Cell for Measurement of Thin Film Out-of-Plane Expansion. II. Hygrothermal Expansion

May 1, 1999

Author(s)

Chad R. Snyder, F I. Mopsik

The data reduction techniques necessary for utilizing the capacitance cell described previously by us for thickness measurements (C.R. Snyder and F.I. Mopsik, Rev. Sci. Instrum., submitted.) in a humid environment are presented. It is demonstrated that our

A precision capacitance cell for measurement of thin film out-of-plane expansion. I. Thermal expansion

January 1, 1999

Author(s)

Chad R. Snyder, F I. Mopsik

Dynamically Induced Loss and Its Implications on Temperature Scans of Relaxation Processes

January 1, 1999

Author(s)

Chad R. Snyder, F I. Mopsik

It is demonstrated that a purely real quantity that changes as a function of time will show a dynamically induced loss (DIL) that is not present under steady-state conditions (when measured at a constant frequency). This conclusion is demonstrated through