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Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology.

Published

Author(s)

Chad R. Snyder, J P. Looney, M P. Casassa
Citation
NIST Interagency/Internal Report (NISTIR) - 6864
Report Number
6864

Keywords

Dielectric Properties, Electronic Materials, Filled Polymers, Lithography, Mechanical Properties, Microscopy, Multiphase Materials, Nanostructured Materials, National Nanotechnology Initiative, Simulations & Modeling, Thin Films, nanotechnology

Citation

Snyder, C. , Looney, J. and Casassa, M. (2002), Survey of FY 2001 Nanotechnology-Related Research at the National Institute of Standards and Technology., NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.6864 (Accessed February 27, 2024)
Created January 1, 2002, Updated November 10, 2018