Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Dynamically Induced Loss and Its Implications on Temperature Scans of Relaxation Processes



Chad R. Snyder, F I. Mopsik


It is demonstrated that a purely real quantity that changes as a function of time will show a dynamically induced loss (DIL) that is not present under steady-state conditions (when measured at a constant frequency). This conclusion is demonstrated through both generalized arguments and by examining some specific functional forms of time evolution equations, including one that resembles a glass transition. Our results show that techniques such as dielectric thermal analysis (DETA), dynamic mechanical thermal analysis (DMTA), and modulated DSC (MDSC), which perform measurements of complex quantities while scanning in temperature, may have some serious problems. Therefore, results obtained from these techniques should be examined carefully before using them to prove or disapprove theoretical model predictions, especially in the neighborhood of a phase transition.
Journal of Chemical Physics
No. 2


complex response, DETA, DMTA, dynamically induced loss, MDSC, relaxation, scanning


Snyder, C. and Mopsik, F. (1999), Dynamically Induced Loss and Its Implications on Temperature Scans of Relaxation Processes, Journal of Chemical Physics, [online], (Accessed March 4, 2024)
Created December 31, 1998, Updated October 12, 2021