Dynamically Induced Loss and Its Implications on Temperature Scans of Relaxation Processes

Published

January 1, 1999

Author(s)

Chad R. Snyder, F I. Mopsik

Abstract

It is demonstrated that a purely real quantity that changes as a function of time will show a dynamically induced loss (DIL) that is not present under steady-state conditions (when measured at a constant frequency). This conclusion is demonstrated through both generalized arguments and by examining some specific functional forms of time evolution equations, including one that resembles a glass transition. Our results show that techniques such as dielectric thermal analysis (DETA), dynamic mechanical thermal analysis (DMTA), and modulated DSC (MDSC), which perform measurements of complex quantities while scanning in temperature, may have some serious problems. Therefore, results obtained from these techniques should be examined carefully before using them to prove or disapprove theoretical model predictions, especially in the neighborhood of a phase transition.

Citation

Journal of Chemical Physics

Volume

110

Issue

No. 2

Pub Type

Journals

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Keywords

complex response, DETA, DMTA, dynamically induced loss, MDSC, relaxation, scanning

Citation

Snyder, C. and Mopsik, F. (1999), Dynamically Induced Loss and Its Implications on Temperature Scans of Relaxation Processes, Journal of Chemical Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851439 (Accessed April 19, 2024)