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Search Publications by: Chad R. Snyder (Fed)

Displaying 151 - 157 of 157

Dynamically Induced Loss and Its Implications on Temperature Scans of Relaxation Processes

January 1, 1999

Author(s)

Chad R. Snyder, F I. Mopsik

It is demonstrated that a purely real quantity that changes as a function of time will show a dynamically induced loss (DIL) that is not present under steady-state conditions (when measured at a constant frequency). This conclusion is demonstrated through

A Precision Capacitance Cell for Measurement of Thin Film Out-of-Plane Expansion I Thermal Expansion

November 1, 1998

Author(s)

Chad R. Snyder, F I. Mopsik

A high sensitivity technique based on a three-terminal parallel plate capacitor for the measurement of the out-of-plane expansion of thin films is presented. The necessary assembly protocols and data reduction techniques for the proper use of this

Limitations on Distinguishing Between Representations of Relaxation Data Over Narrow Frequency Ranges

October 1, 1998

Author(s)

Chad R. Snyder, F I. Mopsik

In this article, we examine the ability to distinguish between relaxation functions with data over limited range of frequency. It is demonstrated that over these limited frequency ranges under a variety of conditions, the Cole-Cole equation can be used to

High Sensitivity Technique for Measurement of Thin Film Out-of-Plane Expansion

March 1, 1998

Author(s)

Chad R. Snyder, F I. Mopsik

We have developed a technique utilizing a capacitance measurement for the accurate determination of the out-of-plane expansion of thin films on the order of 1 micrometer thick. This is important because the coefficient of thermal expansion (CTE) is a key