Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

A Precision Capacitance Cell for Measurement of Thin Film Out-of-Plane Expansion I Thermal Expansion

Published

Author(s)

Chad R. Snyder, F I. Mopsik

Abstract

A high sensitivity technique based on a three-terminal parallel plate capacitor for the measurement of the out-of-plane expansion of thin films is presented. The necessary assembly protocols and data reduction techniques for the proper use of this capacitance cell are presented. To demonstrate the ability of the technique to produce correct results for the thermal expansion of materials, the results on single crystal Al2O3 are shown and compared to the literature. Also, results for a thin polymeric film designed for use as an interlayer dielectric are shown to display the utility of the technique to resolve the measurement of displacement in thin films.
Citation
Review of Scientific Instruments
Volume
69
Issue
No. 11

Keywords

capacitance cell, high sensitivity displacement, inner layer dielectrics, out-of-plane expansion, thermal expansion, thin films, three-terminal measurement

Citation

Snyder, C. and Mopsik, F. (1998), A Precision Capacitance Cell for Measurement of Thin Film Out-of-Plane Expansion I Thermal Expansion, Review of Scientific Instruments, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851453 (Accessed July 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created November 1, 1998, Updated February 19, 2017