Skip to main content

NOTICE: Due to a lapse in annual appropriations, most of this website is not being updated. Learn more.

Form submissions will still be accepted but will not receive responses at this time. Sections of this site for programs using non-appropriated funds (such as NVLAP) or those that are excepted from the shutdown (such as CHIPS and NVD) will continue to be updated.

U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications by: Alan Keith Thompson (Fed)

Search Title, Abstract, Conference, Citation, Keyword or Author
Displaying 51 - 75 of 97

New Limit on the D Coefficient in Polarized Neutron Decay

January 1, 2000
Author(s)
L Lising, S R. Hwang, J M. Adams, T J. Bowles, M C. Browne, T E. Chupp, K A. Coulterpark, Maynard S. Dewey, S J. Freedman, B K. Fujikawa, A Garcia, G L. Greene, G L. Jones, Hans P. Mumm, Jeffrey S. Nico, J M. Richardson, R G. Robertson, W A. Teasdale, Alan K. Thompson, E G. Wasserman, Fred E. Wietfeldt, R C. Welsh, J F. Wilkerson

Time Reversal in Polarized Neutron Decay - The emiT Experiment

January 1, 2000
Author(s)
G L. Jones, J M. Adams, J M. Anaya, T J. Bowles, T E. Chupp, K A. Coulterpark, Maynard S. Dewey, S J. Freedman, B K. Fujikawa, A Garcia, G L. Greene, S -. Hwang, L Lising, Hans Pieter Mumm, Jeffrey S. Nico, R G. Robertson, T D. Steiger, W A. Teasdale, Alan Keith Thompson, E G. Wasserman, Fred E. Wietfeldt, J F. Wilkerson

Measurements and Predictions of Light Scattering by Coatings

May 1, 1999
Author(s)
Theodore V. Vorburger, Egon Marx, M E. McKnight, Maria Nadal, P Y. Barnes, Alan Keith Thompson, Michael Galler, Fern Y. Hunt, Mark R. VanLandingham
We show comparisons between calculations and measurements of angle-resolved light scattering distributions from clear dielectric, isotropic coatings. The calculated distributions are derived from topography measurements performed with scanning white light
Was this page helpful?