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Search Publications by: Alamgir Karim (Assoc)

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Displaying 76 - 100 of 200

Energy Analysis of Multi-Lens Adhesion Measurements

March 1, 2004
Author(s)
Aaron M. Forster, Christopher Stafford, Alamgir Karim
The NIST Combinatorial Methods Center (NCMC) has adapted the Johnson Kendall, and Roberts (JKR) adhesive contact test for the development of a high-throughput adhesion measurement platform. This technique utilizes an array of hemispherical lenses to

Finite-Size Effects on Surface Segregation in Polymer Blend Films Above and Below the Critical Point of Phase Separation

March 1, 2004
Author(s)
H Grull, Li Piin Sung, Alamgir Karim, Jack F. Douglas, Sushil K. Satija, Makoto Hayashi, H Jinnai, TT Hashimoto, Charles C. Han
We investigate the influence of temperature and confinement on surface segregation in thin films of deuterated polybutadiene and polyisoprene near the critical point for phase separation. Neutron reflectivity measurements show that polyisoprene enriches at

Combinatorial Techniques to Measure Curing of Epoxy Films

February 1, 2004
Author(s)
Aaron M. Forster, D Ragahavan, Naomi Eidelman, Alamgir Karim
Combinatorial methods were implemented in the investigation of time and temperature effects on epoxy curing by using three complementary techniques: axisymmetric adhesion testing, FT-IR reflectance mapping, and confocal fluorescence mapping to characterize

Phase Behavior of PS - PVME Nanocomposites

January 1, 2004
Author(s)
K Yurekli, Alamgir Karim, Eric J. Amis, R Krishnamoorti
The influence of nanometer thick, highly anisotropic organically modified layered silicate (montmorillonite) on the phase behavior of deuterated polystyrene (dPS) and polyvinylmethylether (PVME) is investigated using a combination of small angle neutron

Combinatorial Chemistry

October 13, 2003
Author(s)
J D. Hewes, Debra L. Kaiser, Alamgir Karim, Eric J. Amis
In 1995, the rapid fabrication of tens, hundreds, and, eventually, tens of thousands of samples in two-dimensional arrays of discrete microscaled samples (pixels) using lithography methods developed for the electronics industry was reported. Importantly

Combinatorial Characterization of Cell Interactions with Polymer Surfaces

September 1, 2003
Author(s)
J C. Meredith, J L. Sormana, B G. Keselowsky, A J. Garcia, Alessandro Tona, Alamgir Karim, Eric J. Amis
The combinatorial library and high-throughput techniques presented here allow rapid, efficient, and accurate exploration of the effects of microstructure and surface features on cell adhesion and proliferation. The new technique serves as a natural

High-Throughput Measurements of Polymer Adhesion and Mechanical Properties

September 1, 2003
Author(s)
Christopher Stafford, Aaron M. Forster, C Harrison, Cher H. Davis, Eric J. Amis, Alamgir Karim
Polymer adhesion is important to numerous technologies including electronic packaging, coatings and paints, biomedical implants, and pressure-sensitive adhesives. The challenge is to understand the fundamental driving forces for the development of adhesive

Modification of Thin Film Phase Separation by a Surfactant

March 25, 2003
Author(s)
Li Piin Sung, Alamgir Karim, Jack F. Douglas, Charles C. Han
Phase separation in thin films leads to the formation of surface patterns (holes, bumps, and bicontinuous surface features) which depend on the film composition. These features are interpreted to arise from surface tension variations within the film that

Chemically Amplified Resist Fundamentals Studies by Combinatorial approaches

March 1, 2003
Author(s)
M Wang, Vivek Prabhu, Eric K. Lin, Michael J. Fasolka, Alamgir Karim
Sub-100 nm lithography requires more understanding of photoresist material properties and processing conditions to achieve necessary critical dimension control of patterned structures. As resist thickness and feature linewidth decrease, fundamental