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Search Publications by: Alamgir Karim (Assoc)

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Displaying 51 - 75 of 200

Pattern-directed to isotropic dewetting transition in polymer films on micropatterned surfaces with differential surface energy contrast

January 27, 2007
Author(s)
D Julthongpiput, Wenhua Zhang, Jack F. Douglas, Alamgir Karim, Michael J. Fasolka
Surface chemical patterns can both cause and direct dewetting in overlying thin films. However, a key factor in this behavior, the magnitude of surface energy differences between pattern domains ( ?g ), is largely unevaluated. To probe the effect of this

Wetting-Dewetting Transition Line in Thin Polystyrene Films

September 9, 2005
Author(s)
H Raghavan, K M. Ashley, A Seghal, Jack F. Douglas, Alamgir Karim
We review recent advances in the application of combinatorial methods to polymer thin film characterization. Combinatorial methods allow the rapid exploration of multidimensional parameter spaces that naturally arise in the description of polymer film

Combinatorial Peel Tests for the Characterization of Adhesion Behavior of Polymeric Films

February 1, 2005
Author(s)
R Song, Martin Chiang, A J. Crosby, Alamgir Karim, Eric J. Amis, Naomi Eidelman
The self-adhesion behavior of an optically smooth poly(methyl methacrylate) (PMMA) thin film (ca.. 100 nm) on different evaporated metal substrates has been investigated using a combinatorial method approach. In this investigation through high-throughput

Discrete Combinatorial Investigation of Polymer Mixture Phase Boundaries

January 1, 2005
Author(s)
J Cabral, Alamgir Karim
We report a combinatorial approach for mapping bulk polymer mixture phase behavior. The technique consists of a parallel cloud point detection scheme using discrete composition libraries, which are scanned across a temperature range and optically imaged

A New Design for High-Throughput Peel Tests: Statistical Analysis and Example

December 1, 2004
Author(s)
A Chiche, Weiping Zhang, Christopher Stafford, Alamgir Karim
The peel test is one of the most common techniques to investigate the properties of pressure sensitive adhesives (PSAs). As the demand increases for combinatorial tools to rapidly test material performance, designinig a high-throughput peel test is a

A Buckling-Based Metrology for Measuring the Elastic Moduli of Polymeric Thin Films

August 1, 2004
Author(s)
Christopher Stafford, Eva Simonyi, C Harrison, Kathryn Beers, Alamgir Karim, Eric J. Amis, Mark R. VanLandingham, H C. Kim, W Volksen, R D. Miller
As technology continues towards smaller, thinner and lighter devices, more stringent demands are placed on thin polymer films as diffusion barriers, dielectric coatings, electronic packaging and so on. Therefore, there is a growing need for testing

An Open Source Informatics System for Combinatorial Materials Research

March 1, 2004
Author(s)
Weiping Zhang, Michael J. Fasolka, Alamgir Karim, Eric J. Amis
Laboratory Research Informatics Systems (LRIS) hold great promise in streamlining research generally, and are particularly necessary for new data-intensive research strategies such as combinatorial and high-throughput approaches. In this talk, we describe

Energy Analysis of Multi-Lens Adhesion Measurements

March 1, 2004
Author(s)
Aaron M. Forster, Christopher Stafford, Alamgir Karim
The NIST Combinatorial Methods Center (NCMC) has adapted the Johnson Kendall, and Roberts (JKR) adhesive contact test for the development of a high-throughput adhesion measurement platform. This technique utilizes an array of hemispherical lenses to