Imaging Phase Separated Domains in Conducting Polymer Blend Films With Near-Field Scanning Optical Microscopy

Published

August 1, 2001

Author(s)

Jeeseong C. Hwang, Lori S. Goldner, Alamgir Karim, C L. Gettinger

Abstract

We report on the use of near-field scanning optical microscopy to study phase-separation in polymer films of polmer films of poly(styrene) and poly (3-octylthiophene). Transmission and transmitted fluorescence near-field scanning optical microscope (NSOM) images were taken to directly visualize intermediate steps of phase separation in a regime where small domain sizes prevent investigation by conventional microscopy. The interpretation of near-field data on samples with large or varying film thickness or topography are also discussed and a method for analyzing topographically induced artifacts in a quantitative way is suggested.

Citation

Applied Optics

Volume

40

Issue

No. 22

Pub Type

Journals

Download Paper

Local Download

Keywords

conductive blends, near surface optical microscopy, NSOM, phase separated films, poly (3-octylthiophene), polystyrene

Citation

Hwang, J. , Goldner, L. , Karim, A. and Gettinger, C. (2001), Imaging Phase Separated Domains in Conducting Polymer Blend Films With Near-Field Scanning Optical Microscopy, Applied Optics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851870 (Accessed October 10, 2024)