Roberson, S.
, Sehgal, A.
, Fahey, A.
and Karim, A.
(2003),
Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-SIMS) For High-Throughput Characterization Of Biosurfaces, Applied Surface Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853847
(Accessed December 15, 2024)
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Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-SIMS) For High-Throughput Characterization Of Biosurfaces
Published
Author(s)
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Citation
Applied Surface Science
Volume
203-204
Pub Type
Journals
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Keywords
Biomaterials, Combinatorial and THE Methods, SIMS, Spectroscopy, UV-ozone, biomaterials, combinatorial, gradient, polymers
Citation
Issues
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Created December 31, 2002, Updated October 12, 2021