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PUBLICATIONS

Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-SIMS) For High-Throughput Characterization Of Biosurfaces

Published

Author(s)

S V. Roberson, A Sehgal, Albert J. Fahey, Alamgir Karim
Citation
Applied Surface Science
Volume
203-204
Pub Type
Journals

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Local Download

Keywords

Biomaterials, Combinatorial and THE Methods, SIMS, Spectroscopy, UV-ozone, biomaterials, combinatorial, gradient, polymers

Citation

Roberson, S. , Sehgal, A. , Fahey, A. and Karim, A. (2003), Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-SIMS) For High-Throughput Characterization Of Biosurfaces, Applied Surface Science, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853847 (Accessed April 26, 2024)

Created December 31, 2002, Updated October 12, 2021