@article{835666, author = {S Roberson and A Sehgal and Albert Fahey and Alamgir Karim}, title = {Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-SIMS) For High-Throughput Characterization Of Biosurfaces}, year = {2003}, number = { 203-204}, month = {2003-01-01 00:01:00}, publisher = {Applied Surface Science}, url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853847}, language = {en}, }