@article{835666,
  author = {S Roberson and A Sehgal and Albert Fahey and Alamgir Karim},
  title = {Time-Of-Flight Secondary Ion Mass Spectrometry (Tof-SIMS) For High-Throughput Characterization Of Biosurfaces},
  year = {2003},
  number = { 203-204},
  month = {2003-01-01 00:01:00},
  publisher = {Applied Surface Science},
  url = {https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=853847},
  language = {en},
}